Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6284119 | DNA base sequencer | Hiroaki MACHIDA, Yusuke Miyazaki | 2001-09-04 |
| 6172709 | Detachable lens block and video camera system including the same | Shiro Yamano, Makoto Amano, Akira Tamura | 2001-01-09 |
| 5245403 | Apparatus for detecting extraneous substances on a glass plate | Noboru Kato, Izuo Horai, Toshihiro Kimura | 1993-09-14 |
| 5225886 | Method of and apparatus for detecting foreign substances | Yoshimasa Ohshima | 1993-07-06 |
| 5146509 | Method of inspecting defects in circuit pattern and system for carrying out the method | Yasuhiko Hara, Shigeki Kitamura | 1992-09-08 |
| RE33991 | Foreign particle detecting method and apparatus | Masataka Shiba, Sachio Uto | 1992-07-14 |
| 5098191 | Method of inspecting reticles and apparatus therefor | Minori Noguchi, Hiroaki Shishido, Nobuyuki Akiyama, Toshihilo Nakata | 1992-03-24 |
| 5046847 | Method for detecting foreign matter and device for realizing same | Toshihiko Nakata, Nobuyuki Akiyama, Yoshihiko Yamuchi, Yoshimasa Oshima | 1991-09-10 |
| 4952058 | Method and apparatus for detecting abnormal patterns | Minori Noguchi, Hiroaki Shishido | 1990-08-28 |
| 4933565 | Method and apparatus for correcting defects of X-ray mask | Hiroshi Yamaguchi, Keiya Saito, Akira Shimase, Satoshi Haraichi, Tateoki Miyauchi +2 more | 1990-06-12 |
| 4922308 | Method of and apparatus for detecting foreign substance | Minori Noguchi, Hiroaki Shishido, Sachio Uto, Yoshimasa Ohshima | 1990-05-01 |
| 4814596 | Detection of surface particles by dual semiconductor lasers having stable illumination intensities | Yoshimasa Ohshima | 1989-03-21 |
| 4740079 | Method of and apparatus for detecting foreign substances | Yoshimasa Ohshima, Minoru Tanaka | 1988-04-26 |
| 4674875 | Method and apparatus for inspecting surface defects on the magnetic disk file memories | — | 1987-06-23 |
| 4669875 | Foreign particle detecting method and apparatus | Masataka Shiba, Sachio Uto | 1987-06-02 |
| 4668089 | Exposure apparatus and method of aligning exposure mask with workpiece | Yoshitada Oshida, Masataka Shiba, Toshihiko Nakata, Naoto Nakashima | 1987-05-26 |
| 4614427 | Automatic contaminants detection apparatus | Yoshimasa Oshima, Nobuyuki Akiyama, Toshiaki Yachi | 1986-09-30 |
| 4541715 | Apparatus for detecting contaminants on the reticle of exposure system | Nobuyuki Akiyama | 1985-09-17 |
| 4504045 | Wafer transforming device | Yukio Kenbo, Nobuyuki Akiyama, Asahiro Kuni | 1985-03-12 |
| 4475223 | Exposure process and system | Motoya Taniguchi, Nobuyuki Akiyama, Yukio Kembo, Minoru Ikeda | 1984-10-02 |
| 4460273 | Test apparatus for defects of plate | Nobuyuki Akiyama, Yoshimasa Ohshima | 1984-07-17 |
| 4433235 | Focusing position detecting device in optical magnifying and observing apparatus | Nobuyuki Akiyama, Yoshimasa Ohshima | 1984-02-21 |
| 4423331 | Method and apparatus for inspecting specimen surface | Nobuyuki Akiyama, Yoshimasa Oshima | 1983-12-27 |