Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6002989 | System for quality control where inspection frequency of inspection apparatus is reset to minimize expected total loss based on derived frequency function and loss value | Masataka Shiba, Kenji Watanabe, Toshimitsu Hamada, Seiji Ishikawa, Naoki Go +2 more | 1999-12-14 |
| 4614427 | Automatic contaminants detection apparatus | Mitsuyoshi Koizumi, Yoshimasa Oshima, Nobuyuki Akiyama | 1986-09-30 |