| 9914077 |
End member for spiral separation membrane element, spiral separation membrane element and separation membrane module |
Shinichi Chikura, Yasuhiro Uda |
2018-03-13 |
| 9504963 |
Spiral separation membrane element |
Shinichi Chikura, Yasuhiro Uda, Kazuhito Yoshida |
2016-11-29 |
| 9061247 |
Separation membrane module |
Shinichi Chikura, Yasuhiro Uda, Hideyuki Yamane, Kazuhito Yoshida, Masashi Beppu +1 more |
2015-06-23 |
| 8758611 |
Edge member for membrane element and membrane element equipped with same |
Masashi Beppu |
2014-06-24 |
| 8568589 |
Connection member and separation membrane module using the same |
Yasuhiro Uda, Masashi Beppu, Shinichi Chikura, Nobuharu Tahara, Masakatsu Takata |
2013-10-29 |
| 6757621 |
Process management system |
Fumio Mizuno, Seiji Isogai, Kenji Watanabe, Yasuhiro Yoshitake, Terushige Asakawa +12 more |
2004-06-29 |
| 6542830 |
Process control system |
Fumio Mizuno, Seiji Isogai, Kenji Watanabe, Yasuhiro Yoshitake, Terushige Asakawa +12 more |
2003-04-01 |
| 6002989 |
System for quality control where inspection frequency of inspection apparatus is reset to minimize expected total loss based on derived frequency function and loss value |
Masataka Shiba, Kenji Watanabe, Seiji Ishikawa, Naoki Go, Toshiaki Yachi +2 more |
1999-12-14 |
| 5493594 |
Method and apparatus for inspection of solder joints by x-ray fluoroscopic imaging |
Kozo Nakahata, Yoshifumi Morioka |
1996-02-20 |
| 5463667 |
Inspection method for soldered joints using x-ray imaging and apparatus therefor |
Toshiaki Ichinose, Takanori Ninomiya, Asahiro Kuni, Kozo Nakahata, Toshihiko Ayabe |
1995-10-31 |
| 5059559 |
Method of aligning and bonding tab inner leads |
Michio Takahashi, Tooru Mita, Yasuo Nakagawa, Hisafumi Iwata, Aizo Kaneda +6 more |
1991-10-22 |
| 5015097 |
Method for inspecting filled state of via-holes filled with fillers and apparatus for carrying out the method |
Mineo Nomoto, Takanori Ninomiya, Hiroya Koshishiba, Yasuo Nakagawa |
1991-05-14 |
| 4872187 |
X-ray tomographic imaging system and method |
Kozo Nakahata, Yasuo Nakagawa, Mineo Nomoto |
1989-10-03 |
| 4776023 |
Pattern inspection method |
Mineo Nomoto, Kozo Nakahata |
1988-10-04 |
| 4772125 |
Apparatus and method for inspecting soldered portions |
Kazushi Yoshimura, Takashi Hiroi, Takanori Ninomiya, Yasuo Nakagawa, Kohichi Karasaki |
1988-09-20 |
| 4744047 |
Pattern test apparatus including a plurality of pattern generators |
Keiichi Okamoto, Mineo Nomoto |
1988-05-10 |
| 4556797 |
Method and apparatus for detecting edge of fine pattern on specimen |
Asahiro Kuni, Hiroshi Makihira, Kazushi Yoshimura |
1985-12-03 |
| 4410278 |
Method and apparatus for appearance inspection |
Hiroshi Makihira, Yasuo Nakagawa, Makoto Udaka |
1983-10-18 |
| 4403294 |
Surface defect inspection system |
Hiroshi Makihira, Yasuo Nakagawa, Makoto Udaka |
1983-09-06 |
| 4291334 |
System for detecting the position of an object |
Michihiro Mese, Seiji Kashioka, Masakazu Ejiri, Takafumi Miyatake, Isamu Yamazaki |
1981-09-22 |
| 4226539 |
Cylindrical body appearance inspection apparatus |
Yasuo Nakagawa, Hiroshi Makihira |
1980-10-07 |