Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8804109 | Defect inspection system | Kenji Aiko, Shuichi Chikamatsu, Minori Noguchi | 2014-08-12 |
| 8428336 | Inspecting method, inspecting system, and method for manufacturing electronic devices | Yoko Ikeda, Junko Konishi, Yuji Takagi, Kenji Obara, Ryo Nakagaki +2 more | 2013-04-23 |
| 8319960 | Defect inspection system | Kenji Aiko, Shuichi Chikamatsu, Minori Noguchi | 2012-11-27 |
| 7733474 | Defect inspection system | Kenji Aiko, Shuichi Chikamatsu, Minori Noguchi | 2010-06-08 |
| 7426023 | Method and apparatus for detecting defects | Yoshimasa Ohshima, Hiroyuki Nakano | 2008-09-16 |
| 7068834 | Inspecting method, inspecting system, and method for manufacturing electronic devices | Yoko Ikeda, Junko Konishi, Yuji Takagi, Kenji Obara, Ryo Nakagaki +2 more | 2006-06-27 |
| 6928375 | Inspection condition setting program, inspection device and inspection system | Makoto Ono, Yohei Asakawa, Kanako Harada | 2005-08-09 |
| 6826735 | Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device | Makoto Ono, Kanako Harada | 2004-11-30 |
| 6775817 | Inspection system and semiconductor device manufacturing method | Makoto Ono, Keiko Kirino | 2004-08-10 |
| 6687633 | Inspection system, inspection apparatus, inspection program, and production method of semiconductor devices | Makoto Ono | 2004-02-03 |
| 6611728 | Inspection system and method for manufacturing electronic devices using the inspection system | Natsuyo Morioka, Junko Konishi, Yoko Ikeda, Kazunori Nemoto, Makoto Ono +1 more | 2003-08-26 |
| 6539272 | Electric device inspection method and electric device inspection system | Makoto Ono, Kazunori Nemoto | 2003-03-25 |
| 5684565 | Pattern detecting method, pattern detecting apparatus, projection exposing apparatus using the same and exposure system | Yoshitada Oshida, Yasuhiro Yoshitake, Minoru Yoshida, Yukihiro Shibata | 1997-11-04 |
| 5293538 | Method and apparatus for the inspection of defects | Yukio Matsuyama, Hitoshi Kubota | 1994-03-08 |
| 5278012 | Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate | Chie Yamanaka, Toshiaki Ichinose, Takanori Ninomiya, Yasuo Nakagawa, Nobuyuki Akiyama | 1994-01-11 |
| 5059559 | Method of aligning and bonding tab inner leads | Michio Takahashi, Tooru Mita, Yasuo Nakagawa, Toshimitsu Hamada, Aizo Kaneda +6 more | 1991-10-22 |