Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8804109 | Defect inspection system | Kenji Aiko, Minori Noguchi, Hisafumi Iwata | 2014-08-12 |
| 8345233 | Inspection apparatus and inspection method | Tadashi Suga, Masayuki Ochi, Takahiko Suzuki, Seiji Otani | 2013-01-01 |
| 8319960 | Defect inspection system | Kenji Aiko, Minori Noguchi, Hisafumi Iwata | 2012-11-27 |
| 8314930 | Inspection device and inspection method | Koichi Taniguchi, Masayuki Ochi, Shigehisa Nozawa | 2012-11-20 |
| 8228496 | Defect inspection method and defect inspection apparatus | Minori Noguchi, Masayuki Ochi, Kenji Aiko | 2012-07-24 |
| 8134701 | Defect inspecting method and apparatus | Minori Noguchi, Kenji Aiko | 2012-03-13 |
| 8102522 | Inspection apparatus and inspection method | Tadashi Suga, Masayuki Ochi, Takahiko Suzuki, Seiji Otani | 2012-01-24 |
| 7953567 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Kenji Aiko, Shigeo Otsuki +4 more | 2011-05-31 |
| 7940383 | Method of detecting defects on an object | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more | 2011-05-10 |
| 7847927 | Defect inspection method and defect inspection apparatus | Minori Noguchi, Masayuki Ochi, Kenji Aiko | 2010-12-07 |
| 7847928 | Inspection device and inspection method | Koichi Taniguchi, Masayuki Ochi, Shigehisa Nozawa | 2010-12-07 |
| 7733474 | Defect inspection system | Kenji Aiko, Minori Noguchi, Hisafumi Iwata | 2010-06-08 |
| 7733475 | Defect inspecting apparatus | Minori Noguchi, Kenji Aiko | 2010-06-08 |
| 7692779 | Apparatus and method for testing defects | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more | 2010-04-06 |
| 7672799 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Kenji Aiko, Shigeo Otsuki +4 more | 2010-03-02 |
| 7639350 | Apparatus and method for testing defects | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more | 2009-12-29 |
| 7535561 | Defect inspecting apparatus | Minori Noguchi, Kenji Aiko | 2009-05-19 |
| 7443496 | Apparatus and method for testing defects | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more | 2008-10-28 |
| 7098055 | Apparatus and method for testing defects | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more | 2006-08-29 |
| 7037735 | Apparatus and method for testing defects | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more | 2006-05-02 |
| 6411377 | Optical apparatus for defect and particle size inspection | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more | 2002-06-25 |