Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196670 | Far-infrared spectroscopy device | Touya ONO, Mizuki MOHARA, Kei Shimura | 2025-01-14 |
| 11977026 | Far-infrared spectroscopy device and far-infrared spectroscopy method | Mizuki MOHARA, Kei Shimura | 2024-05-07 |
| 11644418 | Far-infrared light source and far-infrared spectrometer | Kei Shimura, Mizuki MOHARA | 2023-05-09 |
| 11320309 | Far-infrared spectroscopy device | Kei Shimura, Mizuki Oku | 2022-05-03 |
| 11079275 | Far-infrared spectroscopy device | Kei Shimura, Mizuki Oku | 2021-08-03 |
| 11016023 | Far-infrared spectroscopic device and far-infrared spectroscopic method | Mizuki MOHARA, Kei Shimura | 2021-05-25 |
| 10948347 | Far-infrared spectroscopy device | Kei Shimura, Mizuki Oku | 2021-03-16 |
| 10113959 | Terahertz wave generating device and spectroscopic device using same | Kei Shimura | 2018-10-30 |
| 9164042 | Device for detecting foreign matter and method for detecting foreign matter | Shigeya Tanaka, Yasuko Aoki, Hiroshi Kawaguchi, Kei Shimura | 2015-10-20 |
| 8804109 | Defect inspection system | Shuichi Chikamatsu, Minori Noguchi, Hisafumi Iwata | 2014-08-12 |
| 8723536 | Inspection apparatus, substrate mounting device and inspection method | Yusuke Miyazaki, Yuichiro Iijima, Yuichiro Kato | 2014-05-13 |
| 8577119 | Wafer surface observing method and apparatus | Hiroshi Higashi, Tetsuya Watanabe | 2013-11-05 |
| 8319960 | Defect inspection system | Shuichi Chikamatsu, Minori Noguchi, Hisafumi Iwata | 2012-11-27 |
| 8228496 | Defect inspection method and defect inspection apparatus | Shuichi Chikamatsu, Minori Noguchi, Masayuki Ochi | 2012-07-24 |
| 8134701 | Defect inspecting method and apparatus | Shuichi Chikamatsu, Minori Noguchi | 2012-03-13 |
| 7953567 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Shuichi Chikamatsu, Shigeo Otsuki +4 more | 2011-05-31 |
| 7847927 | Defect inspection method and defect inspection apparatus | Shuichi Chikamatsu, Minori Noguchi, Masayuki Ochi | 2010-12-07 |
| 7733475 | Defect inspecting apparatus | Shuichi Chikamatsu, Minori Noguchi | 2010-06-08 |
| 7733474 | Defect inspection system | Shuichi Chikamatsu, Minori Noguchi, Hisafumi Iwata | 2010-06-08 |
| 7672799 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Shuichi Chikamatsu, Shigeo Otsuki +4 more | 2010-03-02 |
| 7535561 | Defect inspecting apparatus | Shuichi Chikamatsu, Minori Noguchi | 2009-05-19 |
| 5123742 | Laser length measuring instrument | Hideo Takizawa, Kyo Suda | 1992-06-23 |