Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5123742 | Laser length measuring instrument | Hideo Takizawa, Kenji Aiko | 1992-06-23 |
| 4731855 | Pattern defect inspection apparatus | Shigeharu Kimura, Shinobu Hase, Chusuke Munakata, Kanji Kinameri, Yoshitoshi Ito +3 more | 1988-03-15 |
| 4685802 | Small particle detection system | Susumu Saito, Michio Suzuki, Yasuo Yatsugake, Kazuya Tsukada | 1987-08-11 |
| 4464011 | Light beam scanning apparatus and the method | Kensaku Takahashi, Yasuo Yatsugake, Fukuo Iwaya, Makoto Ito, Katsumi Takami | 1984-08-07 |