| 5252719 |
Process for preparing protein-oriented membrane |
Kazuo Takeda, Yoshinori Harada, Hiromichi Shimizu |
1993-10-12 |
| 5140272 |
Method of semiconductor surface measurment and an apparatus for realizing the same |
Shigeru Nishimatsu, Tatsumi Mizutani, Ryo Haruta, Kanji Tsujii, Shigeyuki Hosoki |
1992-08-18 |
| 4876458 |
Apparatus for measuring particles in liquid |
Kazuo Takeda, Yoshitoshi Ito, Noriaki Honma |
1989-10-24 |
| 4827143 |
Monitor for particles of various materials |
Yoshitoshi Itoh |
1989-05-02 |
| 4791288 |
Scanning photon microscope for simulataneously displaying both the ampitude and phase distributions of ac photovoltage or photocurrents |
Kanji Kinameri |
1988-12-13 |
| 4767211 |
Apparatus for and method of measuring boundary surface |
Shinobu Hase, Shigeharu Kimura |
1988-08-30 |
| 4733063 |
Scanning laser microscope with aperture alignment |
Shigeharu Kimura |
1988-03-22 |
| 4731855 |
Pattern defect inspection apparatus |
Kyo Suda, Shigeharu Kimura, Shinobu Hase, Kanji Kinameri, Yoshitoshi Ito +3 more |
1988-03-15 |
| 4672578 |
Method of information recording on a semiconductor wafer |
Kunihiro Yagi, Masaru Miyazaki, Shiyouzou Yoneda |
1987-06-09 |
| 4581578 |
Apparatus for measuring carrier lifetimes of a semiconductor wafer |
Noriaki Honma |
1986-04-08 |
| 4563642 |
Apparatus for nondestructively measuring characteristics of a semiconductor wafer with a junction |
Noriaki Honma |
1986-01-07 |
| 4464627 |
Device for measuring semiconductor characteristics |
Kunihiro Yagi, Teruaki Motooka |
1984-08-07 |
| 4453181 |
Scanning-image forming apparatus using photo response signal |
Hideki Kohno |
1984-06-05 |