Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5252719 | Process for preparing protein-oriented membrane | Kazuo Takeda, Yoshinori Harada, Hiromichi Shimizu | 1993-10-12 |
| 5140272 | Method of semiconductor surface measurment and an apparatus for realizing the same | Shigeru Nishimatsu, Tatsumi Mizutani, Ryo Haruta, Kanji Tsujii, Shigeyuki Hosoki | 1992-08-18 |
| 4876458 | Apparatus for measuring particles in liquid | Kazuo Takeda, Yoshitoshi Ito, Noriaki Honma | 1989-10-24 |
| 4827143 | Monitor for particles of various materials | Yoshitoshi Itoh | 1989-05-02 |
| 4791288 | Scanning photon microscope for simulataneously displaying both the ampitude and phase distributions of ac photovoltage or photocurrents | Kanji Kinameri | 1988-12-13 |
| 4767211 | Apparatus for and method of measuring boundary surface | Shinobu Hase, Shigeharu Kimura | 1988-08-30 |
| 4733063 | Scanning laser microscope with aperture alignment | Shigeharu Kimura | 1988-03-22 |
| 4731855 | Pattern defect inspection apparatus | Kyo Suda, Shigeharu Kimura, Shinobu Hase, Kanji Kinameri, Yoshitoshi Ito +3 more | 1988-03-15 |
| 4672578 | Method of information recording on a semiconductor wafer | Kunihiro Yagi, Masaru Miyazaki, Shiyouzou Yoneda | 1987-06-09 |
| 4581578 | Apparatus for measuring carrier lifetimes of a semiconductor wafer | Noriaki Honma | 1986-04-08 |
| 4563642 | Apparatus for nondestructively measuring characteristics of a semiconductor wafer with a junction | Noriaki Honma | 1986-01-07 |
| 4464627 | Device for measuring semiconductor characteristics | Kunihiro Yagi, Teruaki Motooka | 1984-08-07 |
| 4453181 | Scanning-image forming apparatus using photo response signal | Hideki Kohno | 1984-06-05 |