Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4767211 | Apparatus for and method of measuring boundary surface | Chusuke Munakata, Shigeharu Kimura | 1988-08-30 |
| 4731855 | Pattern defect inspection apparatus | Kyo Suda, Shigeharu Kimura, Chusuke Munakata, Kanji Kinameri, Yoshitoshi Ito +3 more | 1988-03-15 |