Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4791288 | Scanning photon microscope for simulataneously displaying both the ampitude and phase distributions of ac photovoltage or photocurrents | Chusuke Munakata | 1988-12-13 |
| 4731855 | Pattern defect inspection apparatus | Kyo Suda, Shigeharu Kimura, Shinobu Hase, Chusuke Munakata, Yoshitoshi Ito +3 more | 1988-03-15 |
| 4702607 | Three-dimensional structure viewer and method of viewing three-dimensional structure | — | 1987-10-27 |