Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4472633 | Method and apparatus of measuring carrier distribution | — | 1984-09-18 |
| 4464627 | Device for measuring semiconductor characteristics | Chusuke Munakata, Kunihiro Yagi | 1984-08-07 |