Issued Patents All Time
Showing 25 most recent of 39 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196670 | Far-infrared spectroscopy device | Touya ONO, Mizuki MOHARA, Kenji Aiko | 2025-01-14 |
| 11977026 | Far-infrared spectroscopy device and far-infrared spectroscopy method | Mizuki MOHARA, Kenji Aiko | 2024-05-07 |
| 11644418 | Far-infrared light source and far-infrared spectrometer | Mizuki MOHARA, Kenji Aiko | 2023-05-09 |
| 11320309 | Far-infrared spectroscopy device | Mizuki Oku, Kenji Aiko | 2022-05-03 |
| 11079275 | Far-infrared spectroscopy device | Mizuki Oku, Kenji Aiko | 2021-08-03 |
| 11016023 | Far-infrared spectroscopic device and far-infrared spectroscopic method | Mizuki MOHARA, Kenji Aiko | 2021-05-25 |
| 10948347 | Far-infrared spectroscopy device | Mizuki Oku, Kenji Aiko | 2021-03-16 |
| 10613026 | Far-infrared imaging device and far-infrared imaging method | — | 2020-04-07 |
| 10203278 | Far-infrared imaging device and far-infrared imaging method | — | 2019-02-12 |
| 10113959 | Terahertz wave generating device and spectroscopic device using same | Kenji Aiko | 2018-10-30 |
| 9976966 | Defect inspection method and its device | Yukihiro Shibata, Sachio Uto, Toshifumi Honda | 2018-05-22 |
| 9851548 | Optical microscope device and testing apparatus comprising same | Tetsuya Niibori, Mizuki Oku, Naoya Nakai | 2017-12-26 |
| 9513228 | Defect inspection method and its device | Yukihiro Shibata, Sachio Uto, Toshifumi Honda | 2016-12-06 |
| 9194795 | Defect inspection apparatus and defect inspection method | — | 2015-11-24 |
| 9164042 | Device for detecting foreign matter and method for detecting foreign matter | Kenji Aiko, Shigeya Tanaka, Yasuko Aoki, Hiroshi Kawaguchi | 2015-10-20 |
| 9151719 | Inspection apparatus | Koichi Taniguchi, Sachio Uto | 2015-10-06 |
| 8976347 | Inspection apparatus | Mizuki Oku | 2015-03-10 |
| 8921798 | Defect inspection apparatus and defect inspection method | — | 2014-12-30 |
| 8879821 | Defect inspecting device and defect inspecting method | — | 2014-11-04 |
| 8611640 | Inspection apparatus and inspection method | Hiroyuki Yamashita, Norio Sakaiya, Masaaki Ito | 2013-12-17 |
| 8472697 | Method and apparatus for visual inspection | — | 2013-06-25 |
| 8467048 | Pattern defect inspection apparatus and method | Hidetoshi Nishiyama, Sachio Uto, Minori Noguchi | 2013-06-18 |
| 8351683 | Inspection apparatus and inspection method | Hiroyuki Yamashita, Norio Sakaiya, Masaaki Ito | 2013-01-08 |
| 8233145 | Pattern defect inspection apparatus and method | Hidetoshi Nishiyama, Sachio Uto, Minori Noguchi | 2012-07-31 |
| 8194969 | Method and apparatus for visual inspection | — | 2012-06-05 |