Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9506876 | X-ray inspection device, inspection method, and X-ray detector | Yuta Urano, Toshifumi Honda | 2016-11-29 |
| 9164042 | Device for detecting foreign matter and method for detecting foreign matter | Kenji Aiko, Shigeya Tanaka, Hiroshi Kawaguchi, Kei Shimura | 2015-10-20 |
| 8629395 | Charged particle beam apparatus | Hideo Morishita, Michio Hatano, Takashi Ohshima, Mitsugu Sato, Tetsuya Sawahata +1 more | 2014-01-14 |
| 8455823 | Charged particle beam device | Takashi Ichimura, Takeshi Ogashiwa | 2013-06-04 |
| 7705302 | Scanning electron microscope | Tetsuya Sawahata, Mine Araki, Atsushi Muto, Shuichi Takeuchi | 2010-04-27 |
| 7342241 | Method and apparatus for electron-beam lithography | Tsutomu Tawa, Yoshimitsu Saze | 2008-03-11 |
| 6333962 | Non-destructive inspection apparatus and inspection system using it | Hiroshi Kitaguchi, Shigeru Izumi, Hiroshi Miyai, Katsutoshi Sato, Yukiya Hattori | 2001-12-25 |
| 6049586 | Non-destructive inspection apparatus and inspection system using it | Hiroshi Kitaguchi, Shigeru Izumi, Hiroshi Miyai, Katsutoshi Sato, Yukiya Hattori | 2000-04-11 |
| 5933473 | Non-destructive inspection apparatus and inspection system using it | Hiroshi Kitaguchi, Shigeru Izumi, Hiroshi Miyai, Katsutoshi Sato, Yukiya Hattori | 1999-08-03 |
| 5398268 | Nuclear power plant having a water chemistry control system for a primary cooling system thereof and an operation method thereof | Hidefumi Ibe, Masanori Takahashi, Yamato Asakura, Makoto Nagase, Noriyuki Ohnaka +6 more | 1995-03-14 |