Issued Patents All Time
Showing 1–25 of 113 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394723 | Alignment device and alignment method | Shohei HAMADA, Atsushi Miki | 2025-08-19 |
| 11322177 | Orientation device, production method for magnetic recording medium, and magnetic recording medium | Eiji Nakashio, Hidetoshi Sakuma, Shuhei Matsuya, Jun Sasaki | 2022-05-03 |
| 9778206 | Defect inspection device and defect inspection method | Toshifumi Honda, Takahiro Urano | 2017-10-03 |
| 9602780 | Apparatus for inspecting defect with time/spatial division optical system | Masaaki Ito, Takahiro Jingu | 2017-03-21 |
| 9535009 | Inspection system | Kenshiro OHTSUBO, Takahiro Jingu, Masaaki Ito | 2017-01-03 |
| 9182359 | Apparatus and method for inspecting pattern defect | Hisashi Hatano, Hiroyuki Yamashita | 2015-11-10 |
| 8975582 | Method and apparatus for reviewing defects | Toshifumi Honda, Sachio Uto | 2015-03-10 |
| 8902417 | Inspection apparatus | Nobuaki Hirose, Takahiro Jingu, Kazuo Takahashi, Hisashi Hatano | 2014-12-02 |
| 8824774 | Method and apparatus for inspecting patterns formed on a substrate | Kaoru Sakai, Shunji Maeda, Hisae Shibuya | 2014-09-02 |
| 8811712 | Defect inspection method and device thereof | Shunji Maeda, Kaoru Sakai | 2014-08-19 |
| 8760643 | Apparatus and method for inspecting defect in object surface | Sachio Uto, Minori Noguchi | 2014-06-24 |
| 8559000 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Kenji Oka, Takanori Ninomiya +4 more | 2013-10-15 |
| 8558173 | Method of inspecting pattern and inspecting instrument | Mari Nozoe, Shigeaki Hijikata, Kenji Watanabe, Koji Abe | 2013-10-15 |
| 8508727 | Defects inspecting apparatus and defects inspecting method | Sachio Uto, Minori Noguchi, Yoshimasa Ohshima, Akira Hamamatsu, Takahiro Jingu +2 more | 2013-08-13 |
| 8482728 | Apparatus and method for inspecting defect on object surface | Sachio Uto, Minori Noguchi | 2013-07-09 |
| 8467594 | Method and apparatus for inspecting patterns formed on a substrate | Kaoru Sakai, Shunji Maeda, Hisae Shibuya | 2013-06-18 |
| 8467048 | Pattern defect inspection apparatus and method | Kei Shimura, Sachio Uto, Minori Noguchi | 2013-06-18 |
| 8435594 | Evaporation apparatus, method of manufacturing anode using same, and method of manufacturing battery using same | Isamu Konishiike, Chisato Okina, Keisuke Tanabe, Atsuhiro Abe, Kenichi Kawase +2 more | 2013-05-07 |
| 8410460 | Pattern defect inspection method and its apparatus | Minoru Yoshida, Shunji Maeda, Masahiro Watanabe | 2013-04-02 |
| 8274651 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Kenji Oka, Takanori Ninomiya +4 more | 2012-09-25 |
| 8269959 | Inspection method and inspection apparatus | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Takahiro Jingu, Sachio Uto | 2012-09-18 |
| 8270700 | Method and apparatus for pattern inspection | Kaoru Sakai, Shunji Maeda | 2012-09-18 |
| 8254662 | System for monitoring foreign particles, process processing apparatus and method of electronic commerce | Minori Noguchi, Tetsuya Watanabe, Takuaki Sekiguchi | 2012-08-28 |
| 8233145 | Pattern defect inspection apparatus and method | Kei Shimura, Sachio Uto, Minori Noguchi | 2012-07-31 |
| 8228495 | Defects inspecting apparatus and defects inspecting method | Sachio Uto, Minori Noguchi, Yoshimasa Ohshima, Akira Hamamatsu, Takahiro Jingu +2 more | 2012-07-24 |