Issued Patents All Time
Showing 25 most recent of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10529068 | Defect inspection method and apparatus | Osamu Kikuchi, Kenji Sahara | 2020-01-07 |
| 10354372 | Defect inspection method and apparatus | Osamu Kikuchi, Kenji Sahara | 2019-07-16 |
| 9075026 | Defect inspection device and defect inspection method | Takahiro Urano, Toshifumi Honda | 2015-07-07 |
| 8824774 | Method and apparatus for inspecting patterns formed on a substrate | Shunji Maeda, Hisae Shibuya, Hidetoshi Nishiyama | 2014-09-02 |
| 8811712 | Defect inspection method and device thereof | Shunji Maeda, Hidetoshi Nishiyama | 2014-08-19 |
| 8755041 | Defect inspection method and apparatus | Yuta Urano, Akira Hamamatsu, Shunji Maeda | 2014-06-17 |
| 8737718 | Apparatus and method for inspecting defect | Takahiro Urano | 2014-05-27 |
| 8639019 | Method and apparatus for inspecting pattern defects | Shunji Maeda, Takafumi Okabe | 2014-01-28 |
| 8582864 | Fault inspection method | Shunji Maeda | 2013-11-12 |
| 8467594 | Method and apparatus for inspecting patterns formed on a substrate | Shunji Maeda, Hisae Shibuya, Hidetoshi Nishiyama | 2013-06-18 |
| 8427634 | Defect inspection method and apparatus | Yuta Urano, Akira Hamamatsu, Shunji Maeda | 2013-04-23 |
| 8340395 | Defect inspection method and apparatus therefor | Shunji Maeda | 2012-12-25 |
| 8274652 | Defect inspection system and method of the same | Yuta Urano, Shunji Maeda | 2012-09-25 |
| 8275190 | Method and apparatus for inspecting pattern defects | Shunji Maeda, Takafumi Okabe | 2012-09-25 |
| 8270700 | Method and apparatus for pattern inspection | Shunji Maeda, Hidetoshi Nishiyama | 2012-09-18 |
| 8253934 | Method and apparatus for inspecting a pattern formed on a substrate | Minoru Yoshida, Shunji Maeda, Atsushi Shimoda, Takafumi Okabe, Masahiro Watanabe | 2012-08-28 |
| 8216044 | Method and apparatus for calculating game outcomes | — | 2012-07-10 |
| 8103087 | Fault inspection method | Shunji Maeda | 2012-01-24 |
| 8090187 | Pattern inspection method and its apparatus | Shunji Maeda, Takafumi Okabe, Hiroshi Goto, Masayuki Kuwabara, Naoya Takeuchi | 2012-01-03 |
| 8005292 | Method and apparatus for inspecting pattern defects | Shunji Maeda, Takafumi Okabe | 2011-08-23 |
| 7949178 | Pattern inspection method and its apparatus | Shunji Maeda, Takafumi Okabe | 2011-05-24 |
| 7903249 | Method and apparatus for inspecting pattern defects | Minoru Yoshida, Shunji Maeda, Atsushi Shimoda, Takafumi Okabe | 2011-03-08 |
| 7869966 | Inspection method and its apparatus, inspection system | Takafumi Okabe, Shunji Maeda | 2011-01-11 |
| 7848563 | Method and apparatus for inspecting a defect of a pattern | Shunji Maeda, Hisae Shibuya, Hidetoshi Nishiyama | 2010-12-07 |
| 7792352 | Method and apparatus for inspecting pattern defects | Shunji Maeda, Takafumi Okabe | 2010-09-07 |