Issued Patents All Time
Showing 1–25 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385679 | Refrigerant quantity diagnosis device, refrigerant system, and refrigerant quantity diagnosis method | Yoko Kokugan, Hiroshi Kusumoto, Keiko Oka, Noriyuki Tokura, Norikazu Sasaki +2 more | 2025-08-12 |
| 11378521 | Optical condition determination system and optical condition determination method | Hiroaki KASAI, Keiko Oka, Akio Yazaki | 2022-07-05 |
| 10977568 | Information processing apparatus, diagnosis method, and program | Shouzou Miyabe, Tadashi Suzuki | 2021-04-13 |
| 9940184 | Anomaly detecting method, and apparatus for the same | — | 2018-04-10 |
| 9933338 | Health management system, fault diagnosis system, health management method, and fault diagnosis method | Toujirou NODA, Tadashi Suzuki, Naoki Miyakoshi, Toshiaki Kobari, Shouzou Miyabe +1 more | 2018-04-03 |
| 9779495 | Anomaly diagnosis method and apparatus | Shunji Maeda | 2017-10-03 |
| 9659250 | Facility state monitoring method and device for same | Shunji Maeda | 2017-05-23 |
| 9483049 | Anomaly detection and diagnosis/prognosis method, anomaly detection and diagnosis/prognosis system, and anomaly detection and diagnosis/prognosis program | Shunji Maeda | 2016-11-01 |
| 9465387 | Anomaly diagnosis system and anomaly diagnosis method | Toujirou NODA, Shigeyoshi CHIKUMA, Masami Kusano, Naoki Miyakoshi, Tadashi Suzuki | 2016-10-11 |
| 8824774 | Method and apparatus for inspecting patterns formed on a substrate | Kaoru Sakai, Shunji Maeda, Hidetoshi Nishiyama | 2014-09-02 |
| 8682824 | Method and device for monitoring the state of a facility | Shunji Maeda | 2014-03-25 |
| 8660340 | Defect classification method and apparatus, and defect inspection apparatus | Shunji Maeda, Akira Hamamatsu | 2014-02-25 |
| 8654350 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Yuta Urano, Toshiyuki Nakao +1 more | 2014-02-18 |
| 8643834 | Apparatus of inspecting defect in semiconductor and method of the same | Akira Hamamatsu, Shunji Maeda | 2014-02-04 |
| 8630962 | Error detection method and its system for early detection of errors in a planar or facilities | Shunji Maeda | 2014-01-14 |
| 8620061 | Visual inspection method and apparatus and image analysis system | Shunji Maeda | 2013-12-31 |
| 8467594 | Method and apparatus for inspecting patterns formed on a substrate | Kaoru Sakai, Shunji Maeda, Hidetoshi Nishiyama | 2013-06-18 |
| 8437534 | Defect classification method and apparatus, and defect inspection apparatus | Shunji Maeda, Akira Hamamatsu | 2013-05-07 |
| 8355123 | Defect inspection apparatus and its method | Akira Hamamatsu, Shunji Maeda | 2013-01-15 |
| 8310666 | Apparatus of inspecting defect in semiconductor and method of the same | Akira Hamamatsu, Shunji Maeda | 2012-11-13 |
| 8310665 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Yuta Urano, Toshiyuki Nakao +1 more | 2012-11-13 |
| 8306312 | Method and apparatus for detecting pattern defects | Akira Hamamatsu, Yuji Takagi | 2012-11-06 |
| 8149396 | Defect inspection apparatus and its method | Akira Hamamatsu, Shunji Maeda | 2012-04-03 |
| 8144337 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Yuta Urano, Toshiyuki Nakao +1 more | 2012-03-27 |
| 8139841 | Visual inspection method and apparatus and image analysis system | Shunji Maeda | 2012-03-20 |