Issued Patents All Time
Showing 26–43 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8116556 | Method and apparatus for analyzing defect data and a review system | Yuji Takagi | 2012-02-14 |
| 8086422 | Method for analyzing defect data and inspection apparatus and review system | Yuji Takagi | 2011-12-27 |
| 8027527 | Method for analyzing defect data and inspection apparatus and review system | Yuji Takagi | 2011-09-27 |
| 7952699 | Apparatus of inspecting defect in semiconductor and method of the same | Akira Hamamatsu, Shunji Maeda | 2011-05-31 |
| 7940385 | Defect inspection apparatus and its method | Akira Hamamatsu, Shunji Maeda | 2011-05-10 |
| 7912276 | Method and apparatus for detecting pattern defects | Akira Hamamatsu, Yuji Takagi | 2011-03-22 |
| 7848563 | Method and apparatus for inspecting a defect of a pattern | Kaoru Sakai, Shunji Maeda, Hidetoshi Nishiyama | 2010-12-07 |
| 7813539 | Method and apparatus for analyzing defect data and a review system | Yuji Takagi | 2010-10-12 |
| 7751036 | Apparatus of inspecting defect in semiconductor and method of the same | Akira Hamamatsu, Shunji Maeda | 2010-07-06 |
| 7720275 | Method and apparatus for detecting pattern defects | Akira Hamamatsu, Yuji Takagi | 2010-05-18 |
| 7639277 | Method for evaluating color picture tubes and device for the same and method for making color picture tubes | Tatsuo Horiuchi, Yoshinao Nozaki, Yoshio Yoshiwara | 2009-12-29 |
| 7474394 | Apparatus of inspecting defect in semiconductor and method of the same | Akira Hamamatsu, Shunji Maeda | 2009-01-06 |
| 7084968 | Method for analyzing defect data and inspection apparatus and review system | Yuji Takagi | 2006-08-01 |
| 6876445 | Method for analyzing defect data and inspection apparatus and review system | Yuji Takagi | 2005-04-05 |
| 6870169 | Method and apparatus for analyzing composition of defects | Kenji Obara, Yuji Takagi, Naoki Hosoya | 2005-03-22 |
| 6792366 | Method and apparatus for inspecting defects in a semiconductor wafer | Naoki Hosoya, Yuuji Takagi, Kenji Obara | 2004-09-14 |
| 6792367 | Method and apparatus for inspecting defects in a semiconductor wafer | Naoki Hosoya, Yuuji Takagi, Kenji Obara | 2004-09-14 |
| 6741941 | Method and apparatus for analyzing defect information | Kenji Obara, Yuji Takagi | 2004-05-25 |