Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8254662 | System for monitoring foreign particles, process processing apparatus and method of electronic commerce | Hidetoshi Nishiyama, Minori Noguchi, Tetsuya Watanabe | 2012-08-28 |
| 8045148 | System for monitoring foreign particles, process processing apparatus and method of electronic commerce | Hidetoshi Nishiyama, Minori Noguchi, Tetsuya Watanabe | 2011-10-25 |
| 7953567 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Kenji Aiko, Shuichi Chikamatsu +4 more | 2011-05-31 |
| 7672799 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Kenji Aiko, Shuichi Chikamatsu +4 more | 2010-03-02 |
| 7499157 | System for monitoring foreign particles, process processing apparatus and method of electronic commerce | Hidetoshi Nishiyama, Minori Noguchi, Tetsuya Watanabe | 2009-03-03 |
| 7196785 | System for monitoring foreign particles, process processing apparatus and method of electronic commerce | Hidetoshi Nishiyama, Minori Noguchi, Tetsuya Watanabe | 2007-03-27 |