Issued Patents All Time
Showing 1–25 of 53 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8559000 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Kenji Oka, Takanori Ninomiya +4 more | 2013-10-15 |
| 8508727 | Defects inspecting apparatus and defects inspecting method | Sachio Uto, Minori Noguchi, Hidetoshi Nishiyama, Akira Hamamatsu, Takahiro Jingu +2 more | 2013-08-13 |
| 8289507 | Method of apparatus for detecting particles on a specimen | Akira Hamamatsu, Minori Noguchi, Sachio Uto, Taketo Ueno, Hiroyuki Nakano +5 more | 2012-10-16 |
| 8274651 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Kenji Oka, Takanori Ninomiya +4 more | 2012-09-25 |
| 8269959 | Inspection method and inspection apparatus | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Takahiro Jingu, Sachio Uto | 2012-09-18 |
| 8228495 | Defects inspecting apparatus and defects inspecting method | Sachio Uto, Minori Noguchi, Hidetoshi Nishiyama, Akira Hamamatsu, Takahiro Jingu +2 more | 2012-07-24 |
| 8094295 | Inspection method and inspection apparatus | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Takahiro Jingu, Sachio Uto | 2012-01-10 |
| 8040503 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Kenji Oka, Takanori Ninomiya +4 more | 2011-10-18 |
| 8013989 | Defects inspecting apparatus and defects inspecting method | Sachio Uto, Minori Noguchi, Hidetoshi Nishiyama, Akira Hamamatsu, Takahiro Jingu +2 more | 2011-09-06 |
| 7952700 | Method of apparatus for detecting particles on a specimen | Akira Hamamatsu, Minori Noguchi, Sachio Uto, Taketo Ueno, Hiroyuki Nakano +5 more | 2011-05-31 |
| 7940383 | Method of detecting defects on an object | Minori Noguchi, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo, Ryouji Matsunaga +7 more | 2011-05-10 |
| 7903244 | Method for inspecting defect and apparatus for inspecting defect | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Takahiro Jingu, Sachio Uto | 2011-03-08 |
| 7817261 | Method of apparatus for detecting particles on a specimen | Akira Hamamatsu, Minori Noguchi, Sachio Uto, Taketo Ueno, Hiroyuki Nakano +5 more | 2010-10-19 |
| 7768634 | Defects inspecting apparatus and defects inspecting method | Sachio Uto, Minori Noguchi, Hidetoshi Nishiyama, Akira Hamamatsu, Takahiro Jingu +2 more | 2010-08-03 |
| 7692779 | Apparatus and method for testing defects | Minori Noguchi, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo, Ryouji Matsunaga +7 more | 2010-04-06 |
| 7643139 | Method and apparatus for detecting defects | Minori Noguchi, Hiroyuki Nakano | 2010-01-05 |
| 7643138 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Kenji Oka, Takanori Ninomiya +4 more | 2010-01-05 |
| 7639350 | Apparatus and method for testing defects | Minori Noguchi, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo, Ryouji Matsunaga +7 more | 2009-12-29 |
| 7586593 | Inspection method and inspection apparatus | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Takahiro Jingu, Sachio Uto | 2009-09-08 |
| 7586594 | Method for inspecting defect and apparatus for inspecting defect | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Takahiro Jingu, Sachio Uto | 2009-09-08 |
| 7567343 | Method and apparatus for detecting defects on a wafer | Sachio Uto, Yukihiro Shibata | 2009-07-28 |
| 7443496 | Apparatus and method for testing defects | Minori Noguchi, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo, Ryouji Matsunaga +7 more | 2008-10-28 |
| 7426023 | Method and apparatus for detecting defects | Hisafumi Iwata, Hiroyuki Nakano | 2008-09-16 |
| 7417723 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Kenji Oka, Takanori Ninomiya +4 more | 2008-08-26 |
| 7417721 | Defect detector and defect detecting method | Sachio Uto, Minori Noguchi, Hidetoshi Nishiyama, Akira Hamamatsu, Takahiro Jingu +2 more | 2008-08-26 |