| 7940383 |
Method of detecting defects on an object |
Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more |
2011-05-10 |
| 7692779 |
Apparatus and method for testing defects |
Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more |
2010-04-06 |
| 7639350 |
Apparatus and method for testing defects |
Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more |
2009-12-29 |
| 7443496 |
Apparatus and method for testing defects |
Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more |
2008-10-28 |
| 7098055 |
Apparatus and method for testing defects |
Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more |
2006-08-29 |
| 7037735 |
Apparatus and method for testing defects |
Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more |
2006-05-02 |
| 6411377 |
Optical apparatus for defect and particle size inspection |
Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more |
2002-06-25 |