Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8558173 | Method of inspecting pattern and inspecting instrument | Mari Nozoe, Hidetoshi Nishiyama, Kenji Watanabe, Koji Abe | 2013-10-15 |
| 8358406 | Defect inspection method and defect inspection system | Masami Ikota, Tomohiro Funakoshi | 2013-01-22 |
| 7112791 | Method of inspecting pattern and inspecting instrument | Mari Nozoe, Hidetoshi Nishiyama, Kenji Watanabe, Koji Abe | 2006-09-26 |
| 6777677 | Method of inspecting pattern and inspecting instrument | Mari Nozoe, Hidetoshi Nishiyama, Kenji Watanabe, Koji Abe | 2004-08-17 |
| 6583414 | Method of inspecting pattern and inspecting instrument | Mari Nozoe, Hidetoshi Nishiyama, Kenji Watanabe, Koji Abe | 2003-06-24 |