Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12105033 | Inspection system, determination processing apparatus, and inspection method | Teruaki Sano, Kiminori Shigetomi, Nobutaka Tanaka | 2024-10-01 |
| 8664588 | Mass spectrometer | Hiroyuki Noda, Mitsuru Onuma, Yoko Sato, Koji Ishiguro, Hidetoshi Morokuma +1 more | 2014-03-04 |
| 7953567 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Kenji Aiko, Shuichi Chikamatsu +4 more | 2011-05-31 |
| 7672799 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Kenji Aiko, Shuichi Chikamatsu +4 more | 2010-03-02 |