Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11808807 | Semiconductor integrated circuit device and inspection method for semiconductor integrated circuit device | Akeo Satoh, Akira Kotabe | 2023-11-07 |
| 8831899 | Inspecting apparatus and an inspecting method | Akira Hamamatsu, Hideo Ota, Kenji Oka, Takahiro Jingu | 2014-09-09 |
| 8595666 | Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program | Koichi Hayakawa, Takehiro Hirai, Yutaka Tandai, Tamao Ishikawa, Tsunehiro Sakai +3 more | 2013-11-26 |
| 6611728 | Inspection system and method for manufacturing electronic devices using the inspection system | Natsuyo Morioka, Hisafumi Iwata, Junko Konishi, Yoko Ikeda, Makoto Ono +1 more | 2003-08-26 |
| 6539272 | Electric device inspection method and electric device inspection system | Makoto Ono, Hisafumi Iwata | 2003-03-25 |