Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9020237 | Method for optimizing observed image classification criterion and image classification apparatus | Takehiro Hirai, Kozo Miyake | 2015-04-28 |
| 8892494 | Device for classifying defects and method for adjusting classification | Makoto Ono, Yohei Minekawa, Takehiro Hirai, Yuya Isomae | 2014-11-18 |
| 8779360 | Charged particle beam device, defect observation device, and management server | Kozo Miyake, Takehiro Hirai, Kenji Obara | 2014-07-15 |
| 8625906 | Image classification standard update method, program, and image classification device | Yuya Isomae, Fumiaki Endo, Tomohiro Funakoshi, Tsunehiro Sakai | 2014-01-07 |
| 8472696 | Observation condition determination support device and observation condition determination support method | Tomohiro Funakoshi, Tsunehiro Sakai | 2013-06-25 |
| 8428336 | Inspecting method, inspecting system, and method for manufacturing electronic devices | Yoko Ikeda, Hisafumi Iwata, Yuji Takagi, Kenji Obara, Ryo Nakagaki +2 more | 2013-04-23 |
| 8290241 | Analyzing apparatus, program, defect inspection apparatus, defect review apparatus, analysis system, and analysis method | Makoto Ono, Tomohiro Funakoshi | 2012-10-16 |
| 8209135 | Wafer inspection data handling and defect review tool | Tomohiro Funakoshi, Yuko Kariya, Noritsugu Takahashi, Fumiaki Endo | 2012-06-26 |
| 8043772 | Manufacturing method and manufacturing system of semiconductor device | Toshiharu Miwa, Toshihide Kawachi, Shigenori Yamashita, Takeshi Tashiro, Hidekimi Fudo | 2011-10-25 |
| 7424336 | Test data analyzing system and test data analyzing program | Makoto Ono | 2008-09-09 |
| 7068834 | Inspecting method, inspecting system, and method for manufacturing electronic devices | Yoko Ikeda, Hisafumi Iwata, Yuji Takagi, Kenji Obara, Ryo Nakagaki +2 more | 2006-06-27 |
| 6611728 | Inspection system and method for manufacturing electronic devices using the inspection system | Natsuyo Morioka, Hisafumi Iwata, Yoko Ikeda, Kazunori Nemoto, Makoto Ono +1 more | 2003-08-26 |