Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6928375 | Inspection condition setting program, inspection device and inspection system | Makoto Ono, Yohei Asakawa, Hisafumi Iwata | 2005-08-09 |
| 6826735 | Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device | Makoto Ono, Hisafumi Iwata | 2004-11-30 |