Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6002989 | System for quality control where inspection frequency of inspection apparatus is reset to minimize expected total loss based on derived frequency function and loss value | Masataka Shiba, Kenji Watanabe, Toshimitsu Hamada, Seiji Ishikawa, Toshiaki Yachi +2 more | 1999-12-14 |