Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6622054 | Method monitoring a quality of electronic circuits and its manufacturing condition and system for it | Hirohito Okuda, Toshifumi Honda, Yuji Takagi, Hideaki Doi, Shigeshi Yoshinaga | 2003-09-16 |
| 6333992 | Defect judgement processing method and apparatus | Yukio Matsuyama, Toshifumi Honda, Ludwig Listl | 2001-12-25 |
| 5780866 | Method and apparatus for automatic focusing and a method and apparatus for three dimensional profile detection | Yukio Matsuyama, Takanori Ninomiya, Hideaki Sasazawa | 1998-07-14 |
| 5459794 | Method and apparatus for measuring the size of a circuit or wiring pattern formed on a hybrid integrated circuit chip and a wiring board respectively | Takanori Ninomiya | 1995-10-17 |
| 5373471 | Semiconductor memory device having redundancy memory cells for replacing defective | Makoto Saeki, Kiyoshi Nagai, Tadashi Abe, Takeshi Fukazawa | 1994-12-13 |