Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12253533 | Methods and apparatus providing calibration of background illumination for sample and/or sample container characterization | Yao-Jen Chang, Patrick Wissmann, Benjamin S. Pollack, Ramkrishna Jangale, Rayal Raj Prasad Nalam Venkat +2 more | 2025-03-18 |
| 11815446 | Methods and apparatus for characterizing a specimen container and specimen | Patrick Wissmann, Benjamin S. Pollack | 2023-11-14 |
| 11073472 | Methods and apparatus for characterizing a specimen using pattern illumination | Patrick Wissmann, Benjamin S. Pollack | 2021-07-27 |
| 7791714 | Device and method for recording distance-measuring images | Marc Fischer, Peter Mengel | 2010-09-07 |
| 6333992 | Defect judgement processing method and apparatus | Hisae Yamamura, Yukio Matsuyama, Toshifumi Honda | 2001-12-25 |
| 6249598 | Solder testing apparatus | Toshifumi Honda, Yukio Matsuyama, Guenter Doemens, Peter Mengel | 2001-06-19 |