Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7105815 | Method and apparatus for collecting defect images | Kenji Obara, Toshifumi Honda | 2006-09-12 |
| 6979821 | Scanning electron microscope | Naomasa Suzuki, Noriaki Arai, Mitsugu Sato, Hideo Todokoro, Yoichi Ose | 2005-12-27 |
| 6765205 | Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using same | Isao Ochiai, Toshiei Kurosaki, Naomasa Suzuki | 2004-07-20 |
| 6555819 | Scanning electron microscope | Naomasa Suzuki, Noriaki Arai, Mitsugu Sato, Hideo Todokoro, Yoichi Ose | 2003-04-29 |
| 5442182 | Electron lens | Toshiyuki Ohashi, Mikio Ichihashi, Yuji Sato | 1995-08-15 |