Issued Patents All Time
Showing 26–50 of 77 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9495280 | Operation verifying apparatus, operation verifying method and operation verifying system | Mamoru Yasuda, Takaya Higashino, Eiji Nabika, Hayato Takabatake, Takuma Ishibashi +1 more | 2016-11-15 |
| 9470640 | Defect inspection method and defect inspection device | Atsushi Taniguchi, Toshifumi Honda, Yukihiro Shibata, Yuta Urano | 2016-10-18 |
| 9436990 | Defect observation method and device therefor | Yuko Otani, Toshifumi Honda | 2016-09-06 |
| 9291574 | Defect inspection method and defect inspection device | Atsushi Taniguchi, Toshifumi Honda, Yukihiro Shibata, Yuta Urano | 2016-03-22 |
| 9217718 | Defect detection method and defect detection device and defect observation device provided with same | Yuko Otani, Takehiro Tachizaki, Masahiro Watanabe | 2015-12-22 |
| 9064916 | Heat treatment method and heat treatment apparatus | Hisashi Inoue, Yasushi Takeuchi | 2015-06-23 |
| 9019492 | Defect inspection device and defect inspection method | Atsushi Taniguchi, Taketo Ueno, Toshifumi Honda | 2015-04-28 |
| 8970836 | Defect inspecting apparatus and defect inspecting method | Atsushi Taniguchi, Taketo Ueno, Yukihiro Shibata, Toshifumi Honda | 2015-03-03 |
| 8953156 | Defect detection method and defect detection device and defect observation device provided with same | Yuko Otani, Takehiro Tachizaki, Masahiro Watanabe | 2015-02-10 |
| 8920744 | Food sterilization method and food sterilization apparatus | — | 2014-12-30 |
| 8830465 | Defect inspecting apparatus and defect inspecting method | Atsushi Taniguchi, Yukihiro Shibata, Taketo Ueno | 2014-09-09 |
| 8741064 | Heat treatment method and heat treatment apparatus | Hisashi Inoue, Yasushi Takeuchi | 2014-06-03 |
| 8230806 | Heat treatment method and heat treatment apparatus wherein the substrate holder is composed of two holder constituting bodies that move relative to each other | Hisashi Inoue, Yasushi Takeuchi | 2012-07-31 |
| 8227265 | Method of measuring pattern shape, method of manufacturing semiconductor device, and process control system | Kana Nemoto, Yasuhiro Yoshitake | 2012-07-24 |
| 8054400 | Display device with waterproof sheet and recessed portion or through hole formed in a surface of the frame member which faces the waterproof sheet | Masaki Tsubokura, Hiroshi Obata, Tsuyoshi Suzuki | 2011-11-08 |
| 8045146 | Method and apparatus for reviewing defect | Keiya Saito, Yasuhiro Yoshitake, Hidetoshi Nishiyama | 2011-10-25 |
| 7940383 | Method of detecting defects on an object | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Yukio Kembo, Ryouji Matsunaga +7 more | 2011-05-10 |
| 7900579 | Heat treatment method wherein the substrate holder is composed of two holder constituting bodies that move relative to each other | Hisashi Inoue, Yasushi Takeuchi | 2011-03-08 |
| 7714955 | Liquid crystal display device | Masaki Tsubokura, Hiroshi Obata, Seigo Abo, Yuji Azuma | 2010-05-11 |
| 7692732 | Display device with waterproof sheet and water absorbing member | Masaki Tsubokura, Hiroshi Obata, Tsuyoshi Suzuki | 2010-04-06 |
| 7692779 | Apparatus and method for testing defects | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Yukio Kembo, Ryouji Matsunaga +7 more | 2010-04-06 |
| 7648815 | Negative photosensitive polyimide composition and method for forming image the same | Hiroshi Itatani | 2010-01-19 |
| 7639350 | Apparatus and method for testing defects | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Yukio Kembo, Ryouji Matsunaga +7 more | 2009-12-29 |
| 7443496 | Apparatus and method for testing defects | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Yukio Kembo, Ryouji Matsunaga +7 more | 2008-10-28 |
| 7098055 | Apparatus and method for testing defects | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Yukio Kembo, Ryouji Matsunaga +7 more | 2006-08-29 |