Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10267745 | Defect detection method and defect detection device and defect observation device provided with same | Yuko Otani, Masahiro Watanabe, Shunichi Matsumoto | 2019-04-23 |
| 9759666 | Defect detection method and defect detection device and defect observation device provided with same | Yuko Otani, Masahiro Watanabe, Shunichi Matsumoto | 2017-09-12 |
| 9217718 | Defect detection method and defect detection device and defect observation device provided with same | Yuko Otani, Masahiro Watanabe, Shunichi Matsumoto | 2015-12-22 |
| 9134279 | Internal defect inspection method and apparatus for the same | Toshihiko Nakata, Tetsuya Matsui, Kazushi Yoshimura, Masahiro Watanabe | 2015-09-15 |
| 9063168 | Scanning probe microscope and measurement method using same | Toshihiko Nakata, Masahiro Watanabe | 2015-06-23 |
| 8982332 | Distance measuring device and distance measuring method | Masahiro Watanabe, Tatsuo Hariyama, Yasuhiro Yoshitake, Tetsuya Matsui, Hirokazu Matsumoto +1 more | 2015-03-17 |
| 8953156 | Defect detection method and defect detection device and defect observation device provided with same | Yuko Otani, Masahiro Watanabe, Shunichi Matsumoto | 2015-02-10 |
| 8787134 | Thermally assisted magnetic recording head inspection method and apparatus | Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Shinji Homma, Tsuneo Nakagomi +2 more | 2014-07-22 |
| 8656509 | Scanning probe microscope and surface shape measuring method using same | Masahiro Watanabe, Toshihiko Nakata | 2014-02-18 |
| 8483035 | Thermally assisted magnetic recording head inspection method and apparatus | Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Shinji Homma, Tsuneo Nakagomi +2 more | 2013-07-09 |
| 8359661 | Magnetic device inspection apparatus and magnetic device inspection method | Masahiro Watanabe, Hideaki Sasazawa, Minoru Yoshida, Tsuneo Nakagomi, Teruaki Tokutomi | 2013-01-22 |