Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8787134 | Thermally assisted magnetic recording head inspection method and apparatus | Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Shinji Homma, Teruaki Tokutomi +2 more | 2014-07-22 |
| 8713710 | Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus | Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Shinji Honma, Teruaki Tokutomi +2 more | 2014-04-29 |
| 8621659 | Cantilever for magnetic force microscope and method of manufacturing the same | Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Tetsuya Matsui, Teruaki Tokutomi | 2013-12-31 |
| 8483035 | Thermally assisted magnetic recording head inspection method and apparatus | Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Shinji Homma, Teruaki Tokutomi +2 more | 2013-07-09 |
| 8359661 | Magnetic device inspection apparatus and magnetic device inspection method | Takehiro Tachizaki, Masahiro Watanabe, Hideaki Sasazawa, Minoru Yoshida, Teruaki Tokutomi | 2013-01-22 |
| 8299784 | Device for transporting magnetic head, device for inspecting magnetic head, and method for manufacturing magnetic head | Teruaki Tokutomi, Akira TOBITA | 2012-10-30 |
| 8278917 | Magnetic head inspection method and magnetic head inspection device | Teruaki Tokutomi | 2012-10-02 |
| 8185968 | Magnetic head inspection method and magnetic head manufacturing method | Norimitsu MATSUSITA | 2012-05-22 |