TM

Tetsuya Matsui

HI Hitachi: 29 patents #976 of 28,497Top 4%
HC Hitachi Engineering & Services Co.: 3 patents #2 of 129Top 2%
HE Hitachi-Ge Nuclear Energy: 2 patents #84 of 313Top 30%
HH Hitachi High-Technologies: 2 patents #968 of 1,917Top 55%
KC Konami Digital Entertainment Co.: 1 patents #313 of 611Top 55%
MS Mitsubishi Hitachi Power Systems: 1 patents #495 of 970Top 55%
SE Seiko Epson: 1 patents #5,551 of 7,774Top 75%
TA Toyo Aluminium: 1 patents #84 of 212Top 40%
Overall (All Time): #89,261 of 4,157,543Top 3%
37
Patents All Time

Issued Patents All Time

Showing 25 most recent of 37 patents

Patent #TitleCo-InventorsDate
12022841 Film for preserving edible meat Keisuke Iwasaki, Hiroshi Izumida, Masakazu Uematsu, Masayoshi Nakayama 2024-07-02
11473908 Ultrasonic inspection system Akinori Tamura, Naoyuki KOUNO, Shinobu Ookido, Hiroshi HANAKI, Hiroshi Okazawa 2022-10-18
11002709 Ultrasonic inspection system Akinori Tamura, Naoyuki KOUNO, Masahiro Koike 2021-05-11
10758815 Game management device, game system, and computer-readable storage medium having program recorded thereon Tsuyoshi Yamaguchi, Koji Toyohara, Tomoharu Okutani, Keiji Matsukita, Daisuke Sogabe +2 more 2020-09-01
9689660 Method and device for monitoring status of turbine blades Akira Nishimizu, Toshiyuki Hiraoka, Masahiro Tooma, Soushi Narishige 2017-06-27
9134279 Internal defect inspection method and apparatus for the same Toshihiko Nakata, Takehiro Tachizaki, Kazushi Yoshimura, Masahiro Watanabe 2015-09-15
8982332 Distance measuring device and distance measuring method Takehiro Tachizaki, Masahiro Watanabe, Tatsuo Hariyama, Yasuhiro Yoshitake, Hirokazu Matsumoto +1 more 2015-03-17
8681328 Dark-field defect inspecting method, dark-field defect inspecting apparatus, aberration analyzing method, and aberration analyzing apparatus Atsushi Taniguchi, Taketo Ueno, Yukihiro Shibata, Shunji Maeda 2014-03-25
8621659 Cantilever for magnetic force microscope and method of manufacturing the same Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Tsuneo Nakagomi, Teruaki Tokutomi 2013-12-31
7884924 Residual stress measuring method and system Shohei Numata, Atsushi Baba 2011-02-08
7872472 Eddy current testing apparatus and eddy current testing method Yutaka Suzuki, Masahiro Koike, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura +4 more 2011-01-18
7841237 Ultrasonic testing apparatus for turbine forks and method thereof Yutaka Suzuki, Masahiro Koike, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura +4 more 2010-11-30
7772840 Eddy current testing method Yutaka Suzuki, Masahiro Koike, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura +4 more 2010-08-10
7536239 Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management method Yoshiaki Ichikawa, Takako Oono, Akira Sekine, Kiyomi Funabashi 2009-05-19
7532946 Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management method Yoshiaki Ichikawa, Takako Oono, Akira Sekine, Kiyomi Funabashi 2009-05-12
7433757 Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management method Yoshiaki Ichikawa, Takako Oono, Akira Sekine, Kiyomi Funabashi 2008-10-07
7272465 Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management method Yoshiaki Ichikawa, Takako Oono, Akira Sekine, Kiyomi Funabashi 2007-09-18
7235967 Eddy current testing probe and eddy current testing apparatus Akira Nishimizu, Masahiro Koike, Yoshio Nonaka, Isao Yoshida 2007-06-26
7171854 Nondestructive inspection apparatus and nondestructive inspection method using elastic guided wave Yoshiaki Nagashima, Masahiro Koike 2007-02-06
7151262 Radioactive gas measurement apparatus and failed fuel detection system Hiroshi Kitaguchi, Atsushi Yamagoshi, Shigeru Izumi, Akihisa Kaihara 2006-12-19
7093490 Ultrasonic flaw detecting method and ultrasonic flaw detector Naoyuki Kono, Masahiro Koike, Masahiro Tooma, Yoshinori Musha, Masahiro Miki 2006-08-22
7092960 Chemical material integrated management system and method thereof Satoshi Ohishi, Yoshiaki Ichikawa, Akira Sekine, Takako Oono 2006-08-15
6980883 Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management method Yoshiaki Ichikawa, Takako Oono, Akira Sekine, Kiyomi Funabashi 2005-12-27
6957583 Ultrasonic array sensor, ultrasonic inspection instrument and ultrasonic inspection method Masahiro Tooma, Naoyuki Kono, Masahiro Koike, Hirokazu Adachi, Takao Shimura +1 more 2005-10-25
6934640 Method and system for comprehensive management of chemical materials Yoshiaki Ichikawa, Akira Sekine, Takako Oono, Hirotaka Satou 2005-08-23