TH

Tatsuo Hariyama

HI Hitachi: 10 patents #4,206 of 28,497Top 15%
HH Hitachi High-Technologies: 3 patents #776 of 1,917Top 45%
Overall (All Time): #372,132 of 4,157,543Top 9%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
11644545 Distance measuring device, distance measuring method, and three-dimensional shape measuring apparatus Kenji MARUNO, Masahiro Watanabe, Yuta Urano, Atsushi Taniguchi 2023-05-09
11635295 Shape measuring system and shape measuring method Masahiro Watanabe, Atsushi Taniguchi, Kenji MARUNO, Akio Yazaki 2023-04-25
11421976 Shape measurement system, probe tip unit, and shape measurement method Masahiro Watanabe, Atsushi Taniguchi, Kenji MARUNO 2022-08-23
11054242 Shape measurement system, probe tip unit, and shape measurement method Masahiro Watanabe, Atsushi Taniguchi, Kenji MARUNO 2021-07-06
10900773 Distance measuring device and three-dimensional shape measuring apparatus Masahiro Watanabe, Atsushi Taniguchi, Kenji MARUNO 2021-01-26
10436572 Three-dimensional shape measuring apparatus, three-dimensional shape measuring probe Masahiro Watanabe, Masayuki Kobayashi 2019-10-08
9733066 Shape measuring method and device Hiroaki KASAI, Masahiro Watanabe 2017-08-15
9541380 Shape measuring method and device Hiroaki KASAI, Masahiro Watanabe 2017-01-10
9062965 Multi-point measuring apparatus and method of FBG sensor having multiple delaying fibers Minoru Yoshida, Masahiro Watanabe 2015-06-23
8982332 Distance measuring device and distance measuring method Takehiro Tachizaki, Masahiro Watanabe, Yasuhiro Yoshitake, Tetsuya Matsui, Hirokazu Matsumoto +1 more 2015-03-17
8253935 Disk surface inspection apparatus, inspection system thereof, and inspection method thereof Hideaki Sasazawa, Minoru Yoshida, Shigeru Serikawa 2012-08-28
8018585 Surface defect inspecting apparatus with defect detection optical system and defect-detected image processing Minoru Yoshida, Shigeru Serikawa 2011-09-13
7898652 Method and apparatus for detecting defects on a disk surface Hideaki Sasazawa, Minoru Yoshida, Shigeru Serikawa 2011-03-01