Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12431429 | Semiconductor device having plural memory cell mats and multiple voltage lines | Makoto Sato, Ryota Suzuki, Kyoka Egami | 2025-09-30 |
| 11948931 | Apparatuses including semiconductor layout to mitigate local layout effects | Ryota Suzuki, Makoto Sato | 2024-04-02 |
| 11848328 | Semiconductor device having STI regions | Ryota Suzuki, Makoto Sato, Kyoka Egami | 2023-12-19 |
| 11646271 | Apparatuses including conductive structure layouts | Ryota Suzuki, Mitsuki Koda, Makoto Sato | 2023-05-09 |
| 11183576 | Gate electrode layout with expanded portions over active and isolation regions | Ryota Suzuki, Makoto Sato | 2021-11-23 |
| 11121085 | Trench walls, conductive structures having different widths and methods of making same | Ryota Suzuki, Mitsuki Koda, Makoto Sato | 2021-09-14 |
| 11004798 | Apparatuses including conductive structure layouts | Ryota Suzuki, Mitsuki Koda, Makoto Sato | 2021-05-11 |
| 10846212 | Evidence gathering system and method | Takahiro Yokoyama, Shinji Hamada, Noriaki Takahashi | 2020-11-24 |
| 10537967 | Laser processing method for plate-shaped workpiece | Saki Kimura | 2020-01-21 |
| 10276413 | Laser processing apparatus | Chikara Aikawa, Yuki Ogawa | 2019-04-30 |
| 9748119 | Wafer processing method | Senichi Ryo, Toshiyuki Yoshikawa, Yukinobu Ohura | 2017-08-29 |
| 9620355 | Wafer processing method | Senichi Ryo, Toshiyuki Yoshikawa, Yukinobu Ohura | 2017-04-11 |
| 9543191 | Wiring structure having interlayer insulating film and wiring line without a barrier layer between | Takenao Nemoto, Takehisa Saito, Yugo Tomita, Akihide Shirotori, Akinobu Teramoto +1 more | 2017-01-10 |
| 8982332 | Distance measuring device and distance measuring method | Takehiro Tachizaki, Masahiro Watanabe, Tatsuo Hariyama, Yasuhiro Yoshitake, Tetsuya Matsui +1 more | 2015-03-17 |
| 8258045 | Device processing method | Hiroshi Morikazu, Noboru Takeda | 2012-09-04 |
| 8252667 | Laser processing method for semiconductor wafer | Hiroshi Morikazu, Noboru Takeda | 2012-08-28 |
| 7886181 | Failure recovery method in cluster system | Tsunehiko Baba, Shinji Hamada, Takashi Ichimura, Noriaki Takahashi | 2011-02-08 |
| 7772092 | Wafer processing method | Kentaro Iizuka, Ryugo Oba | 2010-08-10 |
| 7696067 | Method of manufacturing device | Masaru Nakamura | 2010-04-13 |
| 7130752 | Measuring-instrument remote-calibration system and measuring-instrument remote-calibration method | Haruo Yoshida, Yoshio Hino, Masaru Arai, Masataka Nakazawa | 2006-10-31 |
| 6134503 | Data processing unit for and method of chromatography | Akihiro Adachi | 2000-10-17 |
| 6064481 | Method and apparatus for positioning object in space using a low-coherence laser beam which is reflected by two references to sharpen the interference fringe lines | Kaoru Minoshima | 2000-05-16 |
| 5777745 | Method and apparatus for compensating for noise generated by fluctuation of a medium around an object to be measured | Lijiang Zeng, Keiji Kawachi | 1998-07-07 |
| 5591406 | Automatic exhaust gas analyzer for an internal combustion engine | Kenji Hirai, Akira Aono, Shinya Tsuneda, Yuji Yamashita, Hisayoshi Tanaka +2 more | 1997-01-07 |
| 5394240 | High-accuracy air refractometer utilizing two nonlinear optical crystal producing 1st and 2nd second-harmonic-waves | — | 1995-02-28 |