Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9222915 | Eddy current flaw detection system and eddy current flaw detection method | Akira Nishimizu, So KITAZAWA, Naoyuki Kono, Hisashi Endo, Kenichi Otani +4 more | 2015-12-29 |
| 8616062 | Ultrasonic inspection system and ultrasonic inspection method | Naoyuki Kono, Isao Yoshida, Masahiro Koike, Hiroyuki Nakano, Kenichi Otani +2 more | 2013-12-31 |
| 8619939 | Apparatus for ultrasonic inspection of reactor pressure vessel | Motoyuki Nakamura, Naoyuki Kono, Masahiro Miki, Satoshi Shinohara | 2013-12-31 |
| 8576974 | Apparatus for ultrasonic inspection of reactor pressure vessel | Motoyuki Nakamura, Naoyuki Kono, Masahiro Miki, Satoshi Shinohara | 2013-11-05 |
| 8339130 | Method and apparatus for evaluating length of defect in eddy current testing | Akira Nishimizu, Isao Yoshida, Motoyuki Nakamura, Akihiro Taki, Masahiro Koike | 2012-12-25 |
| 8250923 | Ultrasonic inspection method and ultrasonic inspection apparatus | Kazuya Ehara, Naoyuki Kono, Masahiro Miki | 2012-08-28 |
| 8228058 | Eddy current flaw detection probe | Akira Nishimizu, Hirofumi Ouchi, Yosuke Takatori, Akihiro Taki, Makoto Senoo | 2012-07-24 |
| 8183862 | Eddy current testing device | Hisashi Endo, Akira Nishimizu, Hirofumi Ouchi | 2012-05-22 |
| 7929656 | Apparatus for ultrasonic inspection of reactor pressure vessel | Motoyuki Nakamura, Naoyuki Kono, Masahiro Miki, Satoshi Shinohara | 2011-04-19 |
| 7911206 | Method and apparatus for evaluating length of defect in eddy current testing | Akira Nishimizu, Isao Yoshida, Motoyuki Nakamura, Akihiro Taki, Masahiro Koike | 2011-03-22 |
| 7693251 | Method and apparatus for ultrasonic inspection of reactor pressure vessel | Naoyuki Kono, Masahiro Miki, Motoyuki Nakamura | 2010-04-06 |
| 7278286 | Rolling die and a method of making a rod with a ball portion | Naoshige Taniguchi, Norishige Hayashi, Kazuhiko Masuo | 2007-10-09 |
| 7235967 | Eddy current testing probe and eddy current testing apparatus | Akira Nishimizu, Tetsuya Matsui, Masahiro Koike, Isao Yoshida | 2007-06-26 |