Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8787132 | Method and apparatus for inspecting thermal assist type magnetic head | Naoya Saito, Teruaki Tokutomi, Yoshinori Kitano | 2014-07-22 |
| 8713710 | Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus | Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Tsuneo Nakagomi, Teruaki Tokutomi +2 more | 2014-04-29 |
| 8179134 | Handling robot of magnetic head assembly, magnetic head test method and magnetic head tester | Toshinori Sugiyama, Yoshinori Tokumura, Hideki Mochizuki | 2012-05-15 |
| 7622915 | Magnetic head test method and magnetic head tester | Toshinori Sugiyama, Hideki Mochizuki, Yoshinori Tokumura | 2009-11-24 |
| 6552535 | Defect detector circuit with a signal synthesizer and magnet disk certifier using the same defect detector circuit | Toshiharu Funaki, Kenichi Shitara, Hideki Mochiduki | 2003-04-22 |