Issued Patents All Time
Showing 51–75 of 77 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7092348 | Optical recording apparatus capable of changing the length of synchronization portions | Hideaki Sasazawa, Tohishiko Nakata, Masahiro Watanabe | 2006-08-15 |
| 7084990 | Method and its apparatus for measuring size and shape of fine patterns | Hideaki Sasazawa, Tohishiko Nakata, Masahiro Watanabe | 2006-08-01 |
| 7075884 | Optical recording apparatus capable of changing the length of synchronization portions | Hideaki Sasazawa, Tohishiko Nakata, Masahiro Watanabe | 2006-07-11 |
| 7037735 | Apparatus and method for testing defects | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Yukio Kembo, Ryouji Matsunaga +7 more | 2006-05-02 |
| 6909930 | Method and system for monitoring a semiconductor device manufacturing process | Chie Shishido, Yuji Takagi, Masahiro Watanabe, Yasuhiro Yoshitake, Takashi Iizumi +3 more | 2005-06-21 |
| 6890626 | Imide-benzoxazole polycondensate and process for producing the same | Hiroshi Itatani | 2005-05-10 |
| 6841321 | Method and system for processing a semi-conductor device | Yasuhiro Yoshitake, Yoshiyuki Miyamoto | 2005-01-11 |
| 6801827 | Overlay inspection apparatus for semiconductor substrate and method thereof | Yasuhiro Yoshitake, Toshiharu Miwa | 2004-10-05 |
| 6777159 | Method for forming polyimide pattern using photosensitive polyimide and composition for use therein | Hiroshi Itatani, Tarou Itatani, Tsunenori Sakamoto, Sucheta Gorwadkar, Masanori Komuro | 2004-08-17 |
| 6720117 | Exposure mask with appended mask error data | Yasuhiro Yoshitake, Takeshi Kato, Norio Hasegawa | 2004-04-13 |
| 6697698 | Overlay inspection apparatus for semiconductor substrate and method thereof | Yasuhiro Yoshitake, Toshiharu Miwa | 2004-02-24 |
| 6686107 | Method for producing a semiconductor device | Yasuhiro Yoshitake, Takeshi Kato, Norio Hasegawa | 2004-02-03 |
| 6639348 | CRT having an improved internal conductive coating and making the same | Hiroshi Ito, Kiyoshi Sento, Kazuyuki Nishimura, Nobuhiko Hosotani, Masatoshi Akiyama | 2003-10-28 |
| 6630064 | Composition for electrodeposition of polyimides and method for producing patterned polyimide membranes using the same | Hiroshi Itatani | 2003-10-07 |
| 6627377 | Positive photosensitive poliymide composition | Hiroshi Itatani | 2003-09-30 |
| 6589662 | Composite film | Hiroshi Itatani | 2003-07-08 |
| 6411377 | Optical apparatus for defect and particle size inspection | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Yukio Kembo, Ryouji Matsunaga +7 more | 2002-06-25 |
| 6084664 | Method of and apparatus for inspecting reticle for defects | Hiroaki Shishido | 2000-07-04 |
| 6064477 | Method of and apparatus for inspecting reticle for defects | Hiroaki Shishido | 2000-05-16 |
| 5705459 | Process for the production of polyol ester and ester-containing lubricating oil | Yoshihiro Shiokawa, Yoshifumi Sato, Kinji Kato, Mitsuharu Kitamura | 1998-01-06 |
| 5539514 | Foreign particle inspection apparatus and method with front and back illumination | Hiroaki Shishido | 1996-07-23 |
| 5463095 | Process for the production of esters | Yoshihiro Shiokawa, Tadayoshi Takefumi, Yoshifumi Sato | 1995-10-31 |
| 5208383 | Process for producing aromatic acylation product | Tadayoshi Takefumi, Yoshihiro Shiokawa, Nobuyuki Tokura | 1993-05-04 |
| 5011987 | Process for manufacturing high-purity o-toluic acid | Nobuyuki Tokura, Tadayoshi Takefumi, Yoshihiro Shiokawa | 1991-04-30 |
| 4967011 | Process for decomposing aromatic acylated compound.HF-BF.sub.3 complex | Nobuyuki Tokura, Tadayoshi Takefumi, Tatsuhiko Yanagawa, Yoshihiro Shiokawa, Ichiyo Ohtsuka | 1990-10-30 |