Issued Patents All Time
Showing 51–75 of 80 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8638429 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Akira Hamamatsu | 2014-01-28 |
| 8599369 | Defect inspection device and inspection method | Shigenobu Maruyama, Toshiyuki Nakao, Toshifumi Honda | 2013-12-03 |
| 8514388 | Flaw inspecting method and device therefor | Shigenobu Maruyama, Toshifumi Honda, Toshiyuki Nakao | 2013-08-20 |
| 8482727 | Defect inspection method | Toshiyuki Nakao, Yoshimasa Oshima | 2013-07-09 |
| 8477302 | Defect inspection apparatus | Toshiyuki Nakao, Yoshimasa Oshima, Akira Hamamatsu | 2013-07-02 |
| 8462330 | Method and apparatus for detecting defects | Hiroyuki Nakano, Toshihiko Nakata, Sachio Uto, Akira Hamamatsu, Shunji Maeda | 2013-06-11 |
| 8427634 | Defect inspection method and apparatus | Akira Hamamatsu, Shunji Maeda, Kaoru Sakai | 2013-04-23 |
| 8314929 | Method and its apparatus for inspecting defects | Toshiyuki Nakao, Yoshimasa Oshima | 2012-11-20 |
| 8310665 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Hisae Shibuya, Toshiyuki Nakao +1 more | 2012-11-13 |
| 8274652 | Defect inspection system and method of the same | Kaoru Sakai, Shunji Maeda | 2012-09-25 |
| 8264679 | Inspection apparatus | Yoshimasa Oshima, Toshiyuki Nakao | 2012-09-11 |
| 8218138 | Apparatus and method for inspecting defects | Hiroyuki Nakano, Akira Hamamatsu, Sachio Uto, Yoshimasa Oshima, Hidetoshi Nishiyama +1 more | 2012-07-10 |
| 8144337 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Hisae Shibuya, Toshiyuki Nakao +1 more | 2012-03-27 |
| 8120766 | Inspection apparatus | Yoshimasa Oshima, Toshiyuki Nakao | 2012-02-21 |
| 8115915 | Defect inspection method and apparatus | Toshiyuki Nakao, Yoshimasa Oshima | 2012-02-14 |
| 8107065 | Method and apparatus for detecting defects | Hiroyuki Nakano, Toshihiko Nakata, Sachio Uto, Akira Hamamatsu, Shunji Maeda | 2012-01-31 |
| 7973920 | Apparatus and method for inspecting defects | Hiroyuki Nakano, Akira Hamamatsu, Sachio Uto, Yoshimasa Oshima, Hidetoshi Nishiyama +1 more | 2011-07-05 |
| 7965386 | Method and its apparatus for inspecting defects | Toshiyuki Nakao, Yoshimasa Oshima | 2011-06-21 |
| 7916288 | Defect inspection method | Toshiyuki Nakao, Yoshimasa Oshima | 2011-03-29 |
| 7869024 | Method and its apparatus for inspecting defects | Toshiyuki Nakao, Yoshimasa Oshima | 2011-01-11 |
| 7859656 | Defect inspection method and system | Sachio Uto, Hiroyuki Nakano, Yukihiro Shibata, Akira Hamamatsu | 2010-12-28 |
| 7777876 | Inspection method and inspection device | Izuo Horai, Hirokazu Koyabu, Takahiro Jingu | 2010-08-17 |
| 7768635 | Apparatus and method for inspecting defects | Hiroyuki Nakano, Akira Hamamatsu, Sachio Uto, Yoshimasa Oshima, Hidetoshi Nishiyama +1 more | 2010-08-03 |
| 7751037 | Method and apparatus for detecting defects | Hiroyuki Nakano, Toshihiko Nakata, Sachio Uto, Akira Hamamatsu, Shunji Maeda | 2010-07-06 |
| 7675613 | Defect inspection method | Toshiyuki Nakao, Yoshimasa Oshima | 2010-03-09 |