Issued Patents All Time
Showing 26–50 of 80 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9588055 | Defect inspection apparatus and defect inspection method | Taketo Ueno, Akira Hamamatsu, Toshifumi Honda | 2017-03-07 |
| 9568439 | Defect inspection device and defect inspection method | Toshifumi Honda, Takahiro Jingu, Akira Hamamatsu | 2017-02-14 |
| 9523648 | Defect inspection device and defect inspection method | Toshifumi Honda, Yukihiro Shibata | 2016-12-20 |
| 9506876 | X-ray inspection device, inspection method, and X-ray detector | Toshifumi Honda, Yasuko Aoki | 2016-11-29 |
| 9506872 | Inspection apparatus | Yoshimasa Oshima, Toshiyuki Nakao | 2016-11-29 |
| 9488596 | Defect inspection method and device for same | Toshifumi Honda, Hisashi Hatano | 2016-11-08 |
| 9470640 | Defect inspection method and defect inspection device | Shunichi Matsumoto, Atsushi Taniguchi, Toshifumi Honda, Yukihiro Shibata | 2016-10-18 |
| 9329136 | Defect inspection device and defect inspection method | Toshifumi Honda, Takahiro Jingu, Akira Hamamatsu | 2016-05-03 |
| 9329137 | Defect inspection method and device using same | Yukihiro Shibata, Hideki Fukushima, Toshifumi Honda | 2016-05-03 |
| 9310318 | Defect inspection method and defect inspection device | Toshifumi Honda, Yukihiro Shibata | 2016-04-12 |
| 9291574 | Defect inspection method and defect inspection device | Shunichi Matsumoto, Atsushi Taniguchi, Toshifumi Honda, Yukihiro Shibata | 2016-03-22 |
| 9255888 | Defect inspection method and device for same | Toshifumi Honda, Hisashi Hatano | 2016-02-09 |
| 9228960 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Akira Hamamatsu | 2016-01-05 |
| 9109194 | Device for harvesting bacterial colony and method therefor | Toshifumi Honda, Hiroko Fujita, Muneo Maeshima, Akira Maekawa, Yoshiko Ishida +1 more | 2015-08-18 |
| 9041921 | Defect inspection device and defect inspection method | Toshiyuki Nakao, Shigenobu Maruyama, Toshifumi Honda | 2015-05-26 |
| 9007581 | Inspection method and inspection device | Izuo Horai, Hirokazu Koyabu, Takahiro Jingu | 2015-04-14 |
| 8958062 | Defect inspection method and device using same | Yukihiro Shibata, Toshiyuki Nakao, Toshifumi Honda | 2015-02-17 |
| 8922764 | Defect inspection method and defect inspection apparatus | Toshifumi Honda, Yukihiro Shibata | 2014-12-30 |
| 8804110 | Fault inspection device and fault inspection method | Shigenobu Maruyama, Toshiyuki Nakao, Toshifumi Honda, Yukihiro Shibata | 2014-08-12 |
| 8755041 | Defect inspection method and apparatus | Akira Hamamatsu, Shunji Maeda, Kaoru Sakai | 2014-06-17 |
| 8748795 | Method for inspecting pattern defect and device for realizing the same | Hiroyuki Nakano, Shunji Maeda, Sachio Uto | 2014-06-10 |
| 8711347 | Defect inspection method and device therefor | Toshifumi Honda, Yukihiro Shibata, Toshiyuki Nakao | 2014-04-29 |
| 8705026 | Inspection apparatus | Yoshimasa Oshima, Toshiyuki Nakao | 2014-04-22 |
| 8670116 | Method and device for inspecting for defects | Toshiyuki Nakao, Junguo Xu, Yuki Shimizu, Toshihiko Nakata, Toshifumi Honda +1 more | 2014-03-11 |
| 8654350 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Hisae Shibuya, Toshiyuki Nakao +1 more | 2014-02-18 |