Issued Patents All Time
Showing 51–68 of 68 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5883437 | Method and apparatus for inspection and correction of wiring of electronic circuit and for manufacture thereof | Shigenobu Maruyama, Mikio Hongo, Satoru Todoroki, Masaaki Okunaka, Hideo Matsuzaki +2 more | 1999-03-16 |
| 5780866 | Method and apparatus for automatic focusing and a method and apparatus for three dimensional profile detection | Hisae Yamamura, Yukio Matsuyama, Hideaki Sasazawa | 1998-07-14 |
| 5781294 | Method and apparatus for detecting photoacoustic signal to detect surface and subsurface information of the specimen | Toshihiko Nakata, Hilario Haruomi Kobayashi, Kazushi Yoshimura | 1998-07-14 |
| 5645351 | Temperature measuring method using thermal expansion and an apparatus for carrying out the same | Toshihiko Nakata, Shigeki Hirasawa, Yoko Saito, Mineo Nomoto | 1997-07-08 |
| 5479259 | Method and apparatus for detecting photoacoustic signal | Toshihiko Nakata, Hilario Haruomi Kobayashi | 1995-12-26 |
| 5463667 | Inspection method for soldered joints using x-ray imaging and apparatus therefor | Toshiaki Ichinose, Asahiro Kuni, Kozo Nakahata, Toshimitsu Hamada, Toshihiko Ayabe | 1995-10-31 |
| 5459794 | Method and apparatus for measuring the size of a circuit or wiring pattern formed on a hybrid integrated circuit chip and a wiring board respectively | Hisae Yamamura | 1995-10-17 |
| 5440649 | Method of and apparatus for inspection of external appearance of a circuit substrate, and for displaying abnormality information thereof | Senya Kiyasu | 1995-08-08 |
| 5278012 | Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate | Chie Yamanaka, Toshiaki Ichinose, Hisafumi Iwata, Yasuo Nakagawa, Nobuyuki Akiyama | 1994-01-11 |
| 5015097 | Method for inspecting filled state of via-holes filled with fillers and apparatus for carrying out the method | Mineo Nomoto, Hiroya Koshishiba, Toshimitsu Hamada, Yasuo Nakagawa | 1991-05-14 |
| 4953224 | Pattern defects detection method and apparatus | Toshiaki Ichinose, Yasuo Nakagawa | 1990-08-28 |
| 4910757 | Method and apparatus for X-ray imaging | Senya Kiyasu | 1990-03-20 |
| 4791586 | Method of and apparatus for checking geometry of multi-layer patterns for IC structures | Shunji Maeda, Hitoshi Kubota, Satoru Fushimi, Hiroshi Makihira, Yasuo Nakagawa | 1988-12-13 |
| 4772125 | Apparatus and method for inspecting soldered portions | Kazushi Yoshimura, Takashi Hiroi, Toshimitsu Hamada, Yasuo Nakagawa, Kohichi Karasaki | 1988-09-20 |
| 4654583 | Method and apparatus for detecting defects of printed circuit patterns | Yasuo Nakagawa, Keiya Saito | 1987-03-31 |
| 4641527 | Inspection method and apparatus for joint junction states | Takashi Hiroi, Yasuo Nakagawa | 1987-02-10 |
| 4611292 | Robot vision system | Yasuo Nakagawa | 1986-09-09 |
| 4575304 | Robot system for recognizing three dimensional shapes | Yasuo Nakagawa | 1986-03-11 |