Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5440649 | Method of and apparatus for inspection of external appearance of a circuit substrate, and for displaying abnormality information thereof | Takanori Ninomiya | 1995-08-08 |
| 4910757 | Method and apparatus for X-ray imaging | Takanori Ninomiya | 1990-03-20 |