Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12170374 | Secondary battery | Daisuke Hasegawa, Tomokazu SAITO, Taku Higuti | 2024-12-17 |
| 11245113 | Secondary battery | Takashi TONOKAWA, Yutaka Kosaka, Hikaru TAKANO, Shigefusa Chichibu, Kazunobu Kojima | 2022-02-08 |
| 10705151 | Intermediate structure unit for secondary cell and method for manufacturing secondary cell | Yuki Sato, Tomokazu SAITO | 2020-07-07 |
| 10686210 | Secondary battery mounted chip manufacturing method | Tatsuo Inoue, Tomokazu Saitoh, Juri OGASAWARA, Takashi TONOKAWA, Takuo Kudoh | 2020-06-16 |
| 10090507 | Secondary battery-mounted circuit chip and manufacturing method thereof | Tatsuo Inoue, Kiyoyasu Hiwada, Takashi TONOKAWA, Akira Nakazawa | 2018-10-02 |
| 9735594 | Charging/discharging device | Harutada Dewa, Kiyoyasu Hiwada, Tomokazu SAITO, Akira Nakazawa | 2017-08-15 |
| 8612811 | Defective-ratio predicting method, defective-ratio predicting program, managing method for semiconductor manufacturing apparatus, and manufacturing method for semiconductor device | Chizu Matsumoto, Yuichi Hamamura, Yoshiyuki Tsunoda | 2013-12-17 |
| 8093723 | Method of manufacturing a semiconductor integrated circuit device | Takako Funakoshi, Eiichi Murakami, Kazumasa Yanagisawa, Kan Takeuchi, Hideo Aoki +3 more | 2012-01-10 |
| 7977238 | Method of manufacturing a semiconductor integrated circuit device | Takako Funakoshi, Eiichi Murakami, Kazumasa Yanagisawa, Kan Takeuchi, Hideo Aoki +3 more | 2011-07-12 |
| 7786585 | Semiconductor integrated circuit device | Takako Funakoshi, Eiichi Murakami, Kazumasa Yanagisawa, Kan Takeuchi, Hideo Aoki +3 more | 2010-08-31 |
| 7411301 | Semiconductor integrated circuit device | Takako Funakoshi, Eiichi Murakami, Kazumasa Yanagisawa, Kan Takeuchi, Hideo Aoki +3 more | 2008-08-12 |
| 7023091 | Semiconductor integrated circuit device | Takako Funakoshi, Eiichi Murakami, Kazumasa Yanagisawa, Kan Takeuchi, Hideo Aoki +2 more | 2006-04-04 |
| 6895346 | Method for test conditions | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto | 2005-05-17 |
| 6841405 | Photomask for test wafers | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto | 2005-01-11 |
| 6780660 | System for testing electronic devices | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto | 2004-08-24 |
| 6770496 | Method of testing electronic devices | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto | 2004-08-03 |
| 6771077 | Method of testing electronic devices indicating short-circuit | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto | 2004-08-03 |
| 6656752 | Ion current density measuring method and instrument, and semiconductor device manufacturing method | Nobuyuki Mise, Tatehito Usui, Masato Ikegawa, Kazuo Nojiri, Tetsuo Ono | 2003-12-02 |
| 5661061 | Process for fabricating a semiconductor integrated circuit device having the multi-layered fin structure | Hirohisa Usuami, Masayuki Kojima, Kazuo Nojiri, Keiji Okamoto | 1997-08-26 |