TU

Tatehito Usui

HH Hitachi High-Technologies: 35 patents #72 of 1,917Top 4%
HI Hitachi: 31 patents #867 of 28,497Top 4%
HI Hitach: 1 patents #1 of 68Top 2%
OJ Opnext Japan: 1 patents #100 of 185Top 55%
TT Trecenti Technologies: 1 patents #5 of 22Top 25%
Overall (All Time): #34,511 of 4,157,543Top 1%
64
Patents All Time

Issued Patents All Time

Showing 25 most recent of 64 patents

Patent #TitleCo-InventorsDate
12381071 Plasma processing method and plasma processing apparatus Mitsuru Nagasawa, Soichiro Eto, Shigeru Nakamoto 2025-08-05
12131964 Plasma processing apparatus and plasma processing method Kousuke Fukuchi, Ryoji Asakura, Soichiro Eto, Tsubasa Okamoto, Shigeru Nakamoto 2024-10-29
12051574 Wafer processing method and plasma processing apparatus Hiroyuki Kobayashi, Atsushi Sekiguchi, Soichiro Eto, Shigeru Nakamoto, Kazunori Shinoda +1 more 2024-07-30
11915951 Plasma processing method Hiroyuki Kobayashi, Nobuya Miyoshi, Kazunori Shinoda, Naoyuki Kofuji, Yutaka Kouzuma +4 more 2024-02-27
11875978 Plasma processing apparatus and plasma processing method Tsubasa Okamoto, Miyako Matsui, Shigeru Nakamoto, Naohiro Kawamoto, Atsushi Sekiguchi 2024-01-16
11569135 Plasma processing method and wavelength selection method used in plasma processing Yohei Kawaguchi, Shigeru Nakamoto 2023-01-31
11462416 Plasma processing method and plasma processing apparatus Miyako Matsui, Kenichi Kuwahara, Hiroyuki Kobayashi 2022-10-04
11437289 Plasma processing apparatus and plasma processing method Kousuke Fukuchi, Ryoji Asakura, Soichiro Eto, Tsubasa Okamoto, Shigeru Nakamoto 2022-09-06
11424110 Plasma processing apparatus and operational method thereof Masahito Togami, Kosa Hirota, Satomi Inoue, Shigeru Nakamoto 2022-08-23
11287782 Computer, method for determining processing control parameter, substitute sample, measurement system, and measurement method Takeshi Ohmori, Hyakka Nakada, Masaru Kurihara, Naoyuki Kofuji 2022-03-29
11239097 Etching apparatus and etching method and detecting apparatus of film thickness Soichiro Eto, Hiroyuki Minemura 2022-02-01
11152237 Substitute sample, method for determining control parameter of processing, and measurement system Hyakka Nakada, Takeshi Ohmori, Masaru Kurihara, Naoyuki Kofuji 2021-10-19
11112775 System and method of determining processing condition Hyakka Nakada, Takeshi Ohmori, Masaru Kurihara 2021-09-07
10971369 Plasma processing method and plasma processing apparatus Miyako Matsui, Masaru Izawa, Kenichi Kuwahara 2021-04-06
10672595 Plasma processing apparatus and operation method thereof Takeshi Ohmori, Daisuke Satou, Satomi Inoue, Kenji Maeda 2020-06-02
10665516 Etching method and plasma processing apparatus Miyako Matsui, Kenichi Kuwahara, Naoki Yasui, Masaru Izawa, Takeshi Ohmori 2020-05-26
10453695 Plasma processing apparatus and plasma processing method Soichiro Eto, Takeshi Ohmori, Satomi Inoue 2019-10-22
10020233 Plasma processing apparatus and plasma processing method Shigeru Nakamoto, Satomi Inoue, Kousa Hirota, Kousuke Fukuchi 2018-07-10
10008370 Plasma processing apparatus and operation method thereof Takeshi Ohmori, Daisuke Satou, Satomi Inoue, Kenji Maeda 2018-06-26
9934946 Plasma processing apparatus and operating method of plasma processing apparatus Yohei Kawaguchi, Masahito Togami, Satomi Inoue, Shigeru Nakamoto 2018-04-03
9865439 Plasma processing apparatus Shigeru Nakamoto, Satomi Inoue, Kousuke Fukuchi 2018-01-09
9805940 Plasma processing apparatus and plasma processing method Kousuke Fukuchi, Shigeru Nakamoto, Satomi Inoue 2017-10-31
9767997 Plasma processing apparatus and operational method thereof Masahito Togami, Kosa Hirota, Satomi Inoue, Shigeru Nakamoto 2017-09-19
9741629 Plasma processing apparatus and plasma processing method Kosa Hirota, Satomi Inoue, Shigeru Nakamoto, Kousuke Fukuchi 2017-08-22
9190336 Plasma processing apparatus and plasma processing method Kousuke Fukuchi, Shigeru Nakamoto, Satomi Inoue, Kousa Hirota 2015-11-17