HN

Hyakka Nakada

HI Hitachi: 7 patents #5,859 of 28,497Top 25%
HH Hitachi High-Technologies: 4 patents #265 of 1,200Top 25%
Overall (All Time): #441,308 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
12094146 Contour analysis apparatus, processing condition determination system, shape estimation system, semiconductor device manufacturing system, search apparatus, and data structure used in them Takeshi Ohmori, Naoto Takano 2024-09-17
12036609 Additive manufacturing condition search apparatus, additive manufacturing condition search method, and reference sample Hirotsugu Kawanaka, Noboru Saitou, Shinji Matsushita 2024-07-16
11907235 Plasma processing apparatus including predictive control Yutaka Okuyama, Takeshi Ohmori, Masaru Kurihara 2024-02-20
11657059 Search device, searching method, and plasma processing apparatus Yutaka Okuyama, Takeshi Ohmori, Masaru Kurihara 2023-05-23
11609188 Processing condition determination system and processing condition searching method Takeshi Ohmori 2023-03-21
11393084 Processing recipe generation device Masayoshi Ishikawa, Takeshi Ohmori 2022-07-19
11287782 Computer, method for determining processing control parameter, substitute sample, measurement system, and measurement method Takeshi Ohmori, Masaru Kurihara, Tatehito Usui, Naoyuki Kofuji 2022-03-29
11189470 Search device, search method and plasma processing apparatus Takeshi Ohmori, Naoyuki Kofuji, Masayoshi Ishikawa, Masaru Kurihara 2021-11-30
11152237 Substitute sample, method for determining control parameter of processing, and measurement system Takeshi Ohmori, Tatehito Usui, Masaru Kurihara, Naoyuki Kofuji 2021-10-19
11112775 System and method of determining processing condition Takeshi Ohmori, Tatehito Usui, Masaru Kurihara 2021-09-07
10627788 Retrieval apparatus and retrieval method for semiconductor device processing Takeshi Ohmori, Masayoshi Ishikawa, Masaru Kurihara 2020-04-21