Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10347893 | Secondary battery | Takuo Kudoh, Tatsuo Inoue, Akira Nakazawa, Nobuaki Terakado | 2019-07-09 |
| 10090507 | Secondary battery-mounted circuit chip and manufacturing method thereof | Kazuyuki Tsunokuni, Tatsuo Inoue, Takashi TONOKAWA, Akira Nakazawa | 2018-10-02 |
| 10036780 | Evaluation apparatus and evaluation method of sheet type cell | Harutada Dewa | 2018-07-31 |
| 9972862 | Secondary battery | Takuo Kudoh, Shozo Izumo, Tomokazu SAITO, Akira Nakazawa | 2018-05-15 |
| 9865908 | Electrode structure of solid type secondary battery | Takuo Kudoh, Akira Nakazawa | 2018-01-09 |
| 9799927 | Repair apparatus of sheet type cell | Harutada Dewa, Akira Nakazawa, Nobuaki Terakado | 2017-10-24 |
| 9778284 | Semiconductor probe, testing device and testing method for testing quantum battery | Harutada Dewa, Akira Nakazawa | 2017-10-03 |
| 9748596 | Single layer secondary battery having a folded structure | Takuo Kudoh, Shozo Izumo, Tomokazu SAITO, Akira Nakazawa | 2017-08-29 |
| 9735594 | Charging/discharging device | Harutada Dewa, Tomokazu SAITO, Kazuyuki Tsunokuni, Akira Nakazawa | 2017-08-15 |
| 9164149 | Testing device and testing method for quantum battery using semiconductor probe | Harutada Dewa, Akira Nakazawa, Nobuaki Terakado | 2015-10-20 |
| 5597982 | Electrical connection structure | — | 1997-01-28 |
| 5404564 | High speed data train generating system with no restriction on length of generated data train | Nobuyuki Kasuga | 1995-04-04 |
| 5293080 | Method and apparatus for generating test waveforms to be applied to a device under test | Nobuyuki Kasuga | 1994-03-08 |
| 5289116 | Apparatus and method for testing electronic devices | Jun Kurita, Nobuyuki Kasuga, Yoichiro YAMADA, Shigeru Kuwano, Keita Gunji +1 more | 1994-02-22 |
| 5051689 | Test head with improved shielding | Toshio Tamamura | 1991-09-24 |
| 4975639 | Test head with improved shielding | Toshio Tamamura | 1990-12-04 |
| 4833403 | Method and apparatus for measuring settling characteristics of a device under test by using a measurement system for measuring an input signal by sampling and digitizing said input signal | Toshio Tamamura, Akira Hoshika | 1989-05-23 |