Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6895346 | Method for test conditions | Yuichi Hamamura, Takaaki Kumazawa, Kazuyuki Tsunokuni, Aritoshi Sugimoto | 2005-05-17 |
| 6841405 | Photomask for test wafers | Yuichi Hamamura, Takaaki Kumazawa, Aritoshi Sugimoto, Kazuyuki Tsunokuni | 2005-01-11 |
| 6812540 | Semiconductor integrated circuit device | Norikatsu Takaura, Riichiro Takemura, Hideyuki Matsuoka, Shinichiro Kimura, Ryo Nagai +1 more | 2004-11-02 |
| 6780660 | System for testing electronic devices | Yuichi Hamamura, Takaaki Kumazawa, Aritoshi Sugimoto, Kazuyuki Tsunokuni | 2004-08-24 |
| 6771077 | Method of testing electronic devices indicating short-circuit | Yuichi Hamamura, Takaaki Kumazawa, Aritoshi Sugimoto, Kazuyuki Tsunokuni | 2004-08-03 |
| 6770496 | Method of testing electronic devices | Yuichi Hamamura, Takaaki Kumazawa, Aritoshi Sugimoto, Kazuyuki Tsunokuni | 2004-08-03 |
| 6566719 | Semiconductor integrated circuit | — | 2003-05-20 |
| 6399453 | Process of manufacturing semiconductor integrated circuit device having an amorphous silicon gate | Ryo Nagai, Norikatsu Takaura | 2002-06-04 |
| 6287912 | Method of fabricating semiconductor device | Yoshitaka Tadaki, Toshihiro Sekiguchi, Ryo Nagai, Masafumi Miyamoto, Masayuki Nakamura | 2001-09-11 |
| 6265254 | Semiconductor integrated circuit devices and a method of manufacturing the same | — | 2001-07-24 |
| 6198128 | Method of manufacturing a semiconductor device, and semiconductor device | Yoshitaka Tadaki, Toshihiro Sekiguchi, Ryo Nagai, Masafumi Miyamoto, Masayuki Nakamura +3 more | 2001-03-06 |
| 6077735 | Method of manufacturing semiconductor device | Yuji Ezaki, Shinya Nishio, Fumiaki Saitoh, Hideo Nagasawa, Toshiyuki Kaeriyama +5 more | 2000-06-20 |
| 6020228 | CMOS device structure with reduced short channel effect and memory capacitor | — | 2000-02-01 |
| 4633187 | AM synchronous detecting circuit | Yoshikazu Nishimura, Yoshimi Yasukouchi | 1986-12-30 |