Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7352890 | Method for analyzing circuit pattern defects and a system thereof | Atsushi Shimoda, Yuji Takagi, Takuo Tamura, Yuichi Hamamura, Kenji Watanabe +2 more | 2008-04-01 |
| 7062081 | Method and system for analyzing circuit pattern defects | Atsushi Shimoda, Yuji Takagi, Takuo Tamura, Yuichi Hamamura, Kenji Watanabe +2 more | 2006-06-13 |