Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8796651 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Mitsuo Tokuda +3 more | 2014-08-05 |
| 7897936 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Mitsuo Tokuda +3 more | 2011-03-01 |
| 7791043 | Stage mechanism, electron microscope having the stage mechanism and method of controlling positioning of stage mechanism | Takashi Nagamatsu | 2010-09-07 |
| 7514683 | Scanning electron microscope | Kazuma Tanii, Yuji Kasai, Katsuhiro Sasada | 2009-04-07 |
| 7268356 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Mitsuo Tokuda +3 more | 2007-09-11 |
| 6943945 | Two axis state for microscope | Shuichi Nakagawa | 2005-09-13 |
| 6794663 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Mitsuo Tokuda +3 more | 2004-09-21 |
| 6664552 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Mitsuo Tokuda +3 more | 2003-12-16 |
| 5601686 | Wafer transport method | Yoshio Kawamura, Yoshifumi Kawamoto, Fumihiko Uchida, Kenichi Mizuishi, Natsuki Yokoyama +2 more | 1997-02-11 |
| 5562800 | Wafer transport method | Yoshio Kawamura, Yoshifumi Kawamoto, Fumihiko Uchida, Kenichi Mizuishi, Natsuki Yokoyama +2 more | 1996-10-08 |
| 5420436 | Methods for measuring optical system, and method and apparatus for exposure using said measuring method | Massaaki Ito, Soichi Katagiri, Tsuneo Terasawa, Minoru Hidaka, Eiji Takeda +1 more | 1995-05-30 |
| 5235591 | Stack type optical disc apparatus, sealed and separate type optical head therefor and optical disc medium | Shigeru Nakamura, Seiichi Mita, Masuo Kasai, Masahiro Ojima, Hiroshi Yasuoka +5 more | 1993-08-10 |