Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12106930 | Charged particle beam device | Takafumi Miwa, Go Miya, Seiichiro Kanno | 2024-10-01 |
| 11276548 | Charged particle beam device and charged particle beam adjustment method | Hitomi Sakai, Daisuke Sato, Keiichiro Hitomi, Hiroyuki Saito | 2022-03-15 |
| 9368319 | Method for removing foreign substances in charged particle beam device, and charged particle beam device | Yuji Kasai, Masakazu Takahashi, Hajime Kawano | 2016-06-14 |
| 7514683 | Scanning electron microscope | Yuji Kasai, Katsuhiro Sasada, Eiichi Seya | 2009-04-07 |